2001
DOI: 10.1016/s0169-4332(00)00862-x
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Preparation of indium tin oxide films and doped tin oxide films by an ultrasonic spray CVD process

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Cited by 85 publications
(31 citation statements)
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“…Because all the peaks detected in the XRD patterns could be attributed to tetragonal SnO 2 , it was found that the change in substrate temperature did not affect the type of modifier. If the XRD patterns obtained with different samples are compared, the patterns for samples prepared at room temperature and those prepared at 373 K were almost identical, but the sample prepared at 423 K showed (200) peak intensity with increasing substrate temperature has also been reported by Liu and Zhou [19,20]. An increase in peak intensity with increasing substrate temperature was also observed for the (110) peak.…”
Section: Partial Oxygen Pressuresupporting
confidence: 67%
“…Because all the peaks detected in the XRD patterns could be attributed to tetragonal SnO 2 , it was found that the change in substrate temperature did not affect the type of modifier. If the XRD patterns obtained with different samples are compared, the patterns for samples prepared at room temperature and those prepared at 373 K were almost identical, but the sample prepared at 423 K showed (200) peak intensity with increasing substrate temperature has also been reported by Liu and Zhou [19,20]. An increase in peak intensity with increasing substrate temperature was also observed for the (110) peak.…”
Section: Partial Oxygen Pressuresupporting
confidence: 67%
“…In Fig. 3 are also shown curves of (αhν) 2 vs hν which were used to determine the optical band gap Eg of the ITO and SnO 2 :F films; We have obtained values of Eg = 3.95 eV for ITO and 4.07 eV for SnO 2 , which are similar to those reported elsewhere [13]. It is also observed that the refractive index of the SnO 2 films is significantly greater than that the ITO's.…”
Section: From the Interference Fringes Observed In The Transmission Ssupporting
confidence: 80%
“…The structure of carbon nitride thin film solar cells ITO/a-CNJAI was described elsewhere [ 14,15]. A number of Schottky solar cells having this structure were produced based on a set of depositing conditions.…”
Section: Methodsmentioning
confidence: 99%