Thin films of SrAl2O4:Eu,Dy were successfully deposited on polyethylene substrates at room temperature by pulsed ion-beam evaporation. From X-ray diffraction analysis results, the thin films were found to consist of a crystallized SrAl2O4:Eu,Dy phase. In the measurements of the photoluminescence properties of the thin films, broad peaks at 520 nm, which were characteristic of SrAl2O4:Eu,Dy phosphor, were observed. From the observation by scanning electron microscopy, the thin films were prepared on polyethylene substrates. From various observations, crystallized SrAl2O4:Eu,Dy phosphor thin films on polyethylene substrates were successfully obtained by IBE without damaging the substrates. These results suggest the possibility of IBE to deposit crystallized oxide thin films on various low-melting point substrates.