Nanoelectronic devices integrated with functional complex
oxides
have drawn much attention in recent years. However, due to material
and processing compatibility issues, integrating functional complex
oxides with Si-based devices is challenging, and success has been
limited. As an example, the Bi3Fe2Mn2O
x
(BFMO) supercell system, a single-phase
layered oxide made by compositing BiFeO3 and BiMnO3, has been studied for much of the past decade for its unusual
layered Aurivillius structure and magnetic and ferroelectric properties.
However, most of the BFMO thin film growth has been demonstrated on
single-crystal oxide substrates such as SrTiO3 and LaAlO3. In this work, we demonstrate that the BFMO layered supercell
phase can be integrated on Si with high epitaxial quality using a
buffer stack of TiN/SrTiO3/CeO2. Further understanding
of the strain-controlled growth of the BFMO supercell phase has allowed
such Si integration. Microstructure, magnetic, ferroelectric, and
optical properties of the BFMO films on Si have been characterized
and compared with those of BFMO on SrTiO3 single-crystal
substrates, demonstrating comparable epitaxial quality and physical
properties. Integrating multiferroic BFMO oxides on Si demonstrates
the potential of layered supercell oxides in practical device applications
such as ferroelectric field effect transistors.