2006
DOI: 10.1080/17415970600557273
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Pressure measurement technique in nano- and micro-channels using atomic force microscopy

Abstract: This article presents a method for measuring pressure profiles in nano-or micro-channels from topographic imaging of thin channel surfaces using atomic force microscopy. The pressure distribution is calculated from the measured conduit deformation by solving an inverse problem. The related computational model and inverse formalism are proposed.

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Cited by 3 publications
(4 citation statements)
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“…The use of atomic force microscopy (AFM) for measuring the pressure profile in micro-/ nanochannels has been suggested [9]. The method is based on the measurement of the deflections of the thin plate over the channel surface by the topographic imaging of the thin plate using AFM.…”
Section: Key Research Findingsmentioning
confidence: 99%
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“…The use of atomic force microscopy (AFM) for measuring the pressure profile in micro-/ nanochannels has been suggested [9]. The method is based on the measurement of the deflections of the thin plate over the channel surface by the topographic imaging of the thin plate using AFM.…”
Section: Key Research Findingsmentioning
confidence: 99%
“…More recently, many researchers proposed designs to measure pressure within a microfluidic channel [5][6][7][8][9][10][11][12][13][14] or even within a nanochannel [9,10]. In these studies, the pressure within the micro-/nanochannel is measured by sensing:…”
mentioning
confidence: 99%
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“…15 And there are also other different approaches, such as Kim and Daniel measure pressure-induced deformation on the surface of a device using atomic force microscopy. 16 Most of these approaches have been applied in application showing their effectiveness on pressure sensing but not all of them are appropriate for PDMS based microfluidic system. For example, trapped air approach cannot be implemented for PDMS microfluidic systems since PDMS has air permeability.…”
Section: Related Workmentioning
confidence: 99%