2018
DOI: 10.1364/ol.44.000045
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Principal component analysis-based quantitative differential interference contrast microscopy

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Cited by 12 publications
(3 citation statements)
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“…Figure6(c) shows the retrieved differential thickness image of RBCs. The result is in good agreement with the literature[31]. Figure6(d) presents the height distribution of RBCs, and Fig.6(e) shows a diagonal cross-section of thickness from the selected RBC by the white rectangle in Fig.6(c), showing the biconcave shape of the cell.…”
supporting
confidence: 89%
“…Figure6(c) shows the retrieved differential thickness image of RBCs. The result is in good agreement with the literature[31]. Figure6(d) presents the height distribution of RBCs, and Fig.6(e) shows a diagonal cross-section of thickness from the selected RBC by the white rectangle in Fig.6(c), showing the biconcave shape of the cell.…”
supporting
confidence: 89%
“…As a common method of phase imaging, differential interference contrast (DIC) technology can produce a relief effect for observing phase objects [8,9] . However, the beam splitter prism can only be set in one direction to the image, and the relief effect only enhances the one-dimension edge.…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, reflective differential interference contrast (DIC) digital microscopy system has been widely used in precision processing and inspection fields, such as the observation of conductive particles in thin-film transistor liquid crystal displays [1], the measurement of martensite microstructures, and the classification of individual dielectric nanoparticles [2,3]. DIC microscopy system can be used for qualitative or quantitative measurements of samples [4][5][6][7], as well as for reflective surface assessment [8] and optical profiling [9].…”
Section: Introductionmentioning
confidence: 99%