2019
DOI: 10.1016/j.orgel.2019.03.019
|View full text |Cite
|
Sign up to set email alerts
|

Probe-induced resistive switching memory based on organic-inorganic lead halide perovskite materials

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
15
0

Year Published

2019
2019
2022
2022

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 15 publications
(15 citation statements)
references
References 31 publications
0
15
0
Order By: Relevance
“…Besides optoelectronic devices such as solar cells and LED devices, HOIP materials also show their great potential in memory devices on next‐generation computing systems. Reliable, fast response HOIP‐based memory devices have been demonstrated by different researchers . Yoo et al prepared HOIP‐based memory devices (Au/ HOIP/FTO) with small on–off voltage and remarkable RS behaviors .…”
Section: Ion Migration Induced Phenomena In Hoipsmentioning
confidence: 99%
See 1 more Smart Citation
“…Besides optoelectronic devices such as solar cells and LED devices, HOIP materials also show their great potential in memory devices on next‐generation computing systems. Reliable, fast response HOIP‐based memory devices have been demonstrated by different researchers . Yoo et al prepared HOIP‐based memory devices (Au/ HOIP/FTO) with small on–off voltage and remarkable RS behaviors .…”
Section: Ion Migration Induced Phenomena In Hoipsmentioning
confidence: 99%
“…Ironically, the ion migration process was also found to promote the performance of perovskite devices under continuous light illumination . Moreover, ion migration has found important application in perovskite resistance‐switching memory devices . Finally, by manipulating the ion migration progress under different electric field, dynamic electronic junctions are demonstrated and can be used as fast response photodetectors .…”
Section: Introductionmentioning
confidence: 99%
“…Another experimental observation based on Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) that 18 O ions mainly exist in the surface vicinity within the positively biased region of NiO films reveals that the depletion or accumulation of oxygens ions at the bottom electrode interface caused by oxygen migration within the NiO film changes the film conductivity [78]. Additionally, probe-induced resistive switching behavior has been found on organic-inorganic lead halide perovskite materials (CH 3 NH 3 PbI 3−x Cl x ) [79]. As illustrated in Figure 11(a), the media stack is made up of a CH 3 NH 3 PbI 3−x Cl x film deposited on FTO substrate that also serves as a bottom electrode.…”
Section: Recent Progress On Probe Memoriesmentioning
confidence: 99%
“…In particular, the greatest potential of ReRAM is that many switching materials could be selected. Recently, in addition to its photovoltaic applications, organic–inorganic metal halide perovskite has been demonstrated as an active layer in ReRAM cells, showing tunable and remarkable memory properties and flexibility [ 21 , 22 , 23 , 24 , 25 , 26 , 27 , 28 , 29 , 30 , 31 , 32 , 33 , 34 ]. Based on the various material systems of perovskite, the constituent tuning provides an influential factor in controlling the memory property; [ 34 ] but most of the research about the memory application of the three-dimensional (3D) perovskites is still focused on MAPbI 3 [ 22 , 23 , 25 , 27 , 28 , 29 , 30 ].…”
Section: Introductionmentioning
confidence: 99%
“…Based on the various material systems of perovskite, the constituent tuning provides an influential factor in controlling the memory property; [ 34 ] but most of the research about the memory application of the three-dimensional (3D) perovskites is still focused on MAPbI 3 [ 22 , 23 , 25 , 27 , 28 , 29 , 30 ]. Besides MAPbI 3 , some researchers have reported on the MAPbX 3 based ReRAM where X = Br or Cl or a mixture of I, Br, or Cl [ 21 , 26 , 33 ]. However, only very few studied the memory property of the 3D ABX 3 organic–inorganic metal halide while the A-site cation is not a pure MA.…”
Section: Introductionmentioning
confidence: 99%