Probing material properties with sharp indenters: a retrospective

Lawn, Brian R.; Cook, Robert F.

doi:10.1007/s10853-011-5865-1

Cited by 73 publications

(83 citation statements)

References 169 publications

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“…FEM simulation was conducted using parameters listed in Table 5, in which the yield strength was estimated as H/3 [48]. The results for the coating annealed at 650°C are shown in Fig.…”

Section: Finite Element Modelling (Fem)mentioning

confidence: 99%

Tailoring the physicochemical and mechanical properties of optical copper–cobalt oxide thin films through annealing treatment

Amri

Jiang

Zhao

et al. 2014

Surface and Coatings Technology

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ÔØ Å ÒÙ× Ö ÔØTailoring the physicochemical and mechanical properties of optical copper cobalt oxide thin films through annealing treatment This is a PDF file of an unedited manuscript that has been accepted for publication. As a service to our customers we are providing this early version of the manuscript. The manuscript will undergo copyediting, typesetting, and review of the resulting proof before it is published in its final form. Please note that during the production process errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain. A C C E P T E D M A N U S C R I P T ACCEPTED MANUSCRIPT A C C E P T E D M A N U S C R I P T ACCEPTED MANUSCRIPT2 Abstract Sol-gel dip-coated optical coatings, copper-cobalt oxides on aluminium substrates, were thermally treated at different annealing temperatures in the range 500 -650 °C. The resulting films were characterized using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), UV-Vis-NIR spectrophotometry and nanoindentation techniques. The crystallinity of CoCu 2 O 3 enhanced significantly, with increasing annealing temperature from 500 to 650 °C, while the electronic structure and bonding states of the copper-cobalt oxides matrix remained unchanged. UV-Vis-NIR analysis showed that the solar absorptance (α) of the coatings changed with increasing of annealing temperature and an optimum α (84.4%) was achieved at 550 °C, which also coincides to the maximum tensile residual stress of the coating.Nanoindentation tests exhibited an increasing trend in both the hardness (H) and elastic modulus (E) of the coatings with increase in annealing temperature, although a slight decrease in the H/E ratio was also observed. The experimental studies were complemented by Finite Element Modelling (FEM). The results showed that, under mechanical loading, the stress and plastic deformation were concentrated within the coating layers. As such, the likelihood of delamination of the coating layer upon unloading would be reduced.

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“…FEM simulation was conducted using parameters listed in Table 5, in which the yield strength was estimated as H/3 [48]. The results for the coating annealed at 650°C are shown in Fig.…”

Section: Finite Element Modelling (Fem)mentioning

confidence: 99%

Tailoring the physicochemical and mechanical properties of optical copper–cobalt oxide thin films through annealing treatment

Amri

Jiang

Zhao

et al. 2014

Surface and Coatings Technology

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“…The plastic zone around an impact (or indentation) zone can drive a lateral crack along a weak film-substrate interface, leading to film delamination [26]. Residual deposition stresses can aggravate the delamination by causing buckling in the film [7,14,15,26].…”

Section: Impact Residual Impressionmentioning

confidence: 99%

“…Residual deposition stresses can aggravate the delamination by causing buckling in the film [7,14,15,26]. The delamination is usually evident as surface uplift around the impact, enabling measurement of the crack size and calculation of interface toughness [26].…”

Section: Impact Residual Impressionmentioning

confidence: 99%

“…For both indenters, no cracking in the thin film was observed at the given AFM resolution. However, the subsurface interfacial delamination (buckling or surface uplift around the impact [7,14,15,26], Figure 9) failure can be associated with a distinct features in depth vs. time curve indicating backward depth deviation (at 1 mN, 10 mN and 100 mN loads, repetitions shown in Table 2). This behavior of backward depth deviation has been previously investigated [7] in nano-impact (1000 impacts at 1 mN load using NanoTest™ system) testing of 100 nm thick DLC film.…”

Section: Impact Residual Impressionmentioning

confidence: 99%

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Nano-Impact (Fatigue) Characterization of As-Deposited Amorphous Nitinol Thin Film

Faisal

Ahmed

2012

Coatings

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This paper presents nano-impact (low cycle fatigue) behavior of as-deposited amorphous nitinol (TiNi) thin film deposited on Si wafer. The nitinol film was 3.5 µm thick and was deposited by the sputtering process. Nano-impact tests were conducted to comprehend the localized fatigue performance and failure modes of thin film using a calibrated nano-indenter NanoTest™, equipped with standard diamond Berkovich and conical indenter in the load range of 0.5 mN to 100 mN. Each nano-impact test was conducted for a total of 1000 fatigue cycles. Depth sensing approach was adapted to understand the mechanisms of film failure. Based on the depth-time data and surface observations of films using atomic force microscope, it is concluded that the shape of the indenter test probe is critical in inducing the localized indentation stress and film failure. The measurement technique proposed in this paper can be used to optimize the design of nitinol thin films. Keywords

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“…4 Despite the above mentioned drawbacks, intriguing mechanical properties and deformation mechanisms have been reported using volume confinement by nanoindentation: single or multiple displacement-bursts in the range of the theoretical strength, serrated and highly localized flow phenomena, and phase transformations directly under the indenter are a few heavily cited examples. 1,5 To avoid the above mentioned problems a more intuitive way of testing small structures, ideally a simple geometry with uniaxial loading, can be used. 6 Of course, these experiments are directly coupled to advances made in the field of electron microscopy and micromechanics: initially driven by the need of measuring hardness at very low loads, i.e., small residual imprints, several scanning electron microscope supported in situ indentation devices have been developed.…”

Section: Introductionmentioning

confidence: 99%

A novel apparatus for in situ compression of submicron structures and particles in a high resolution SEM

Romeis

Paul

Ziener

et al. 2012

Review of Scientific Instruments

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We report on the development and characterization of a novel in situ manipulation device to perform stressing experiments on the submicron scale inside a high resolution field emission scanning electron microscope. The instrument comprises two main assembly groups: an upper part for positioning and moving a mounted probe and a force sensor as well as a specimen support as lower part. The upper part consists of a closed loop tripod piezoelectric scanner mounted on a self-locking coarse positioning stage. Two interlocked steel springs and a linear variable differential transformer measuring the springs’ deflections compose the lower part of the instrument. This arrangement acts as force-sensor and sample support. In comparison to already well-established concepts a wide measuring range is covered by adjusting the spring constant between 30 N/m and 50000 N/m. Moreover, the new device offers striking advantages with respect to force calibration and sample deformation measurements. Force calibration is performed using the eigenfrequency of the force detection system directly inside the SEM. Deformation data are obtained with high accuracy by simultaneously recording displacements above and below the specimen. The detrimental apparatus compliance is determined, and the influence on measured data subsequently minimized: an easy to validate two-springs-in-series model is used for data correction. A force resolution in normal direction of 100 nN accompanied by a sample deformation resolution of 5 nm can be achieved with the instrument using an appropriate load cell stiffness. The capabilities and versatility of this instrument are exemplified by compression experiments performed on submicron amorphous silica particles.

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Probing material properties with sharp indenters: a retrospective

Cited by 73 publications

References 169 publications

Tailoring the physicochemical and mechanical properties of optical copper–cobalt oxide thin films through annealing treatment

Tailoring the physicochemical and mechanical properties of optical copper–cobalt oxide thin films through annealing treatment

Nano-Impact (Fatigue) Characterization of As-Deposited Amorphous Nitinol Thin Film

A novel apparatus for in situ compression of submicron structures and particles in a high resolution SEM

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