2021
DOI: 10.3390/cryst11121465
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Probing Surface Information of Alloy by Time of Flight-Secondary Ion Mass Spectrometer

Abstract: In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS. We found by surprise that these two results seem to be inconsistent with each other. Therefore, other surface characteristic tools such as SEM-EDS were further used to provide additional supports. The results indicated that such differences may originate from the v… Show more

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Cited by 9 publications
(4 citation statements)
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“…In addition, the F and LiF distributions of the artificially modified Li 3 BO 3 film are less than those of the original SEI film of the bare Li anode. The composition and content of the SEI film on the surface of the Li anode changed under the protection of the artificial Li 3 BO 3 film, which indicated that it reduced the side reactions between the metal Li anode and the liquid electrolytes. , Consequently, the artificial Li 3 BO 3 film can effectively alleviate the volume change of Li anodes, inhibit the growth of Li dendrites, and increase the cycling stability of the Li metal anode and the battery life.…”
Section: Resultsmentioning
confidence: 99%
“…In addition, the F and LiF distributions of the artificially modified Li 3 BO 3 film are less than those of the original SEI film of the bare Li anode. The composition and content of the SEI film on the surface of the Li anode changed under the protection of the artificial Li 3 BO 3 film, which indicated that it reduced the side reactions between the metal Li anode and the liquid electrolytes. , Consequently, the artificial Li 3 BO 3 film can effectively alleviate the volume change of Li anodes, inhibit the growth of Li dendrites, and increase the cycling stability of the Li metal anode and the battery life.…”
Section: Resultsmentioning
confidence: 99%
“…Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a highly sensitive analytical technique for investigating composition distribution by combining secondary-ion mass spectrometry and ion beam sputtering [44] , [45] , [46] , [47] . Although TOF-SIMS has the potential to provide a precise characterization of the vertical composition distribution in PeLEDs, the organic species in perovskite films inevitably decompose into fragments when interacting with high-energy sputtering ions, such as Ar + and Cs + , thus weakening their ability to analyze the analysis ability toward ligands [45] .…”
Section: Introductionmentioning
confidence: 99%
“…Irregular distribution of In-based nanoclusters has been detected at the GaN/InN and InGaN/AlGaN interfaces with an estimated diameter of ~1-2 nm. To probe the optical, structural, and electrical attributes of compound semiconductors, it has been a customary tradition to instigate a variety of characterization techniques, including reflectivity, absorption [24][25][26][27], high-resolution X-ray diffraction (HR-XRD) [28][29][30][31][32][33][34], extended X-ray absorption fine structures (EXAFs) [35][36][37][38][39][40], photoluminescence (PL) [41][42][43], secondary ion mass spectroscopy [20][21][22][23][24][25][26][27][28] (SIMS), spectroscopic ellipsometry (SE) [28], electron-energy loss (EEL) [43,44] measurements, etc. Other experimental methods such as electron paramagnetic resonance (EPR) and far-infrared (FIR) spectroscopy [21][22][23] are also considered valuable for probing the nature of electronic centers, as well as assessing nanostructured interfacial components by evaluating their vibrational and/or electronic properties .…”
Section: Introductionmentioning
confidence: 99%