2007
DOI: 10.1016/j.susc.2007.05.009
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Probing the interaction at the C60–SiC nanomesh interface

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Cited by 11 publications
(14 citation statements)
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“…This suggests a vacuum level shift relative to the Fermi level due to the formation of interface dipoles, which originate from electron transfer from CuPc or pentacene (electron donor) to the SiC nanomesh. As previously reported, the weak charge transfer between C 60 and SiC nanomesh, which induces a +0.15 ± 0.05 eV vacuum level shift, is responsible for altering the fullerene growth from island mode to layer-by-layer mode within the first two layers. Therefore, the interaction which traps CuPc and pentacene inside the cells of SiC nanomesh is attributed to the weak interface dipoles.…”
Section: Resultssupporting
confidence: 59%
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“…This suggests a vacuum level shift relative to the Fermi level due to the formation of interface dipoles, which originate from electron transfer from CuPc or pentacene (electron donor) to the SiC nanomesh. As previously reported, the weak charge transfer between C 60 and SiC nanomesh, which induces a +0.15 ± 0.05 eV vacuum level shift, is responsible for altering the fullerene growth from island mode to layer-by-layer mode within the first two layers. Therefore, the interaction which traps CuPc and pentacene inside the cells of SiC nanomesh is attributed to the weak interface dipoles.…”
Section: Resultssupporting
confidence: 59%
“…This is due to the surface irregularity of the SiC nanomesh. 22 Another prominent feature is the bumps in the middle of the cells. This feature was observed in the work presented in previous papers, 20,23,24 but its origin is not understood.…”
Section: Resultsmentioning
confidence: 99%
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