Proceedings of the 2006 International Symposium on Low Power Electronics and Design - ISLPED '06 2006
DOI: 10.1145/1165573.1165636
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Process variation aware cache leakage management

Abstract: In a few technology generations, limitations of fabrication processes will make accurate design time power estimates a daunting challenge. Static leakage current which comprises a significant fraction of total power due to large on-chip caches, is exponentially dependent on widely varying physical parameters such as gate length, gate oxide thickness, and dopant ion concentration. In large structures like onchip caches, this may mean that one portion of a cache may consume an order of magnitude larger static po… Show more

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Cited by 41 publications
(12 citation statements)
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“…Most efforts dealing with variation have focused on mitigating and exploiting it in processors [6], [7], [11], [12] or in on-chip memory [13], [14], [15], [16], [17]. Fewer papers have looked at variability in off-chip, DRAM-based memory subsystems.…”
Section: Related Workmentioning
confidence: 99%
“…Most efforts dealing with variation have focused on mitigating and exploiting it in processors [6], [7], [11], [12] or in on-chip memory [13], [14], [15], [16], [17]. Fewer papers have looked at variability in off-chip, DRAM-based memory subsystems.…”
Section: Related Workmentioning
confidence: 99%
“…To obtain a smaller switching delay, the threshold voltage for the transistor must be decreased. Unfortunately, subthreshold leakage current increases exponentially as threshold voltage decreases [13,8]. This suggests modeling the speed to power function as something like P (s) = s α + c, where there is some range of speeds [s min , s max ] that the processor can run at.…”
Section: Technological Motivationsmentioning
confidence: 99%
“…The decrease of feature size introduces random process changes which mainly come from pollution, environmental variation and high temperature [28]. It brings the variation of IC physical structure and degradation of the circuit performance.…”
Section: Trend Of Interconnect Processmentioning
confidence: 99%