2012 IEEE International Meeting for Future of Electron Devices, Kansai 2012
DOI: 10.1109/imfedk.2012.6218634
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Process variation compensation with effective gate-width tuning for low-voltage CMOS digital circuits

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Cited by 4 publications
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“…2 (d). The temperature dependence of the operation speed in the CMOS logic circuits can be reduced with the proposed technique, as shown in previous work [5]; however, it is not so important in this work because the solution temperature is nearly constant for stable DEP operation.…”
Section: Effective Gate-width Tuningmentioning
confidence: 68%
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“…2 (d). The temperature dependence of the operation speed in the CMOS logic circuits can be reduced with the proposed technique, as shown in previous work [5]; however, it is not so important in this work because the solution temperature is nearly constant for stable DEP operation.…”
Section: Effective Gate-width Tuningmentioning
confidence: 68%
“…The body biasing used in previous work [6,7,8] is such a technique; however, at 0.35 V it cannot function sufficiently due to limited body biases. Therefore, we developed an additional process variation compensation technique with effective gate-width tuning [5].…”
Section: System Designmentioning
confidence: 99%
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