1983
DOI: 10.1080/00337578308218625
|View full text |Cite
|
Sign up to set email alerts
|

Progress in the analysis of defect structures with endor spectroscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
3
0

Year Published

1985
1985
1994
1994

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 13 publications
(3 citation statements)
references
References 36 publications
0
3
0
Order By: Relevance
“…l ) , in one degree steps, starting along the three-fold axis (0") and ending along a two-fold axis (90"). Special software algorithms were used to enhance the signal to noise ratio, increase the spectral resolution of the ENDOR data, and automatically determine the positions of peaks in the spectra for the different angles [9].…”
Section: Methodsmentioning
confidence: 99%
“…l ) , in one degree steps, starting along the three-fold axis (0") and ending along a two-fold axis (90"). Special software algorithms were used to enhance the signal to noise ratio, increase the spectral resolution of the ENDOR data, and automatically determine the positions of peaks in the spectra for the different angles [9].…”
Section: Methodsmentioning
confidence: 99%
“…The computercontrolled spectrometer and details of the measurement technique were described elsewhere (Niklas 1983a, b). Special software algorithms were used to enhance the signal-to-noise ratio, to increase the spectral resolution of the ENDOR data and to determine the peak positions of ENDOR lines (Niklas 1983a).…”
Section: Methodsmentioning
confidence: 99%
“…The digital filters conserve the first and second moments of the lines. Often deconvolution procedures are needed when too many ENDOR lines overlap [16].…”
Section: The Arsenic Antisite and El2mentioning
confidence: 99%