Application of the feature-oriented scanning (FOS) method intended for computer processing of the output optical image of an uncooled infrared focal plane array (FPA) of 32×32 elements is described. The FPA sensing elements are micromechanical bimaterial infrared (IR) detectors. The FPA under consideration is a microoptomechanical system (MOMS). Reading out the FPA optical image in visible spectral region is carried out by means of an optical profiler (interference microscope). The suggested method allows to exclude points from the output optical image, which do not carry useful information about the imaged IR-object, as well as to take into account artefacts introduced by the reading profiler. The method is suitable for determination of an array of correcting factors eliminating a non-uniform response of the FPA bimaterial detectors on input IR-radiation. The method can also be applied to automatic characterization of experimental MOMSs and for a spot-check outgoing inspection of commercial MOMSs.