Properties of Indium Tin Oxide Thin Films Deposited on Polymer Substrates

Mohamed, S. H.; El-Hossary, F.M.; Gamal, G. A.; Kahlid, M.M.

doi:10.12693/aphyspola.115.704

Cited by 43 publications

(19 citation statements)

References 27 publications

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“…When the structure of the films becomes crystalline, these electrons are released from the bound. Similar observations have been reported for CuAlS 2 , ITO and NiO thin films by [9], [10] and [11] respectively. More so, the high values of resistivity of as deposited films may be due to the presence of disorder, high density of state and structural defects in the film as observed in XRD which renders the films amorphous.…”

Section: Resultssupporting

confidence: 90%

Study of influence of sulfurisation temperature on the resistivity and surface morphology of thermally evaporated CuAlS2 thin films

2017

IJASRE

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Section: Resultssupporting

confidence: 90%

Study of influence of sulfurisation temperature on the resistivity and surface morphology of thermally evaporated CuAlS2 thin films

2017

IJASRE

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“…The AFM analysis shows the highest value of rms surface roughness for the undoped ZnS film, which may lead to enhanced scattering loss, and that can be the reason for low transmittance observed in the undoped ZnS film. 40 When the silver incorporation increases beyond 1 wt. %, transmittance of the films decreases systematically.…”

Section: F Optical Analysismentioning

confidence: 99%

Surface plasmon resonance in nanostructured Ag incorporated ZnS films

2015

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Silver incorporated zinc sulfide thin films are prepared by RF magnetron sputtering technique and the influence of silver incorporation on the structural, optical and luminescence properties is analyzed using techniques like grazing incidence X-Ray diffraction (GIXRD), atomic force microscopy (AFM), field emission scanning electron microscopy (FESEM), energy dispersive X-ray spectroscopy (EDS), micro-Raman spectroscopy, UV-Vis spectroscopy and laser photoluminescence spectroscopy. XRD analysis presents hexagonal wurtzite structure for the films. A reduction of crystallinity of the films is observed due to Ag incorporation. The Raman spectral analysis confirms the reduction of crystallinity and increase of strain due to the Ag incorporation. AFM analysis reveals a rough surface morphology for the undoped film and Ag incorporation makes the films uniform, dense and smooth. A blue shift of band gap energy with increase in Ag incorporation is observed due to quantum confinement effect. An absorption band (450-650 nm region) due to surface plasmon resonance of the Ag clusters present in the ZnS matrix is observed for the samples with higher Ag incorporation. The complex dielectric constant, loss factor and distribution of volume and surface energy loss of the ZnS thin films are calculated. Laser photoluminescence measurements gives an intense bluish green emission from the ZnS films and a quenching of the PL emission is observed which can be due to the metal plasmonic absorption and non-radiative energy transfer due to Ag incorporation. C 2015 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License. [http://dx

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“…At% ratio of Sn:In was found to be *1.12 in all the cases. Indium tin oxide is essentially formed by substitutional doping of In 2 O 3 with Sn replacing the In(III) atoms from the cubic bixbyite structure of indium oxide [32]. However, in ITO both substitutional tin and oxygen vacancies contribute to the conductivity [33,34].…”

Section: Surface Morphology Analysis By Scanning Electron Microscopy mentioning

confidence: 99%

Study of conducting ITO thin film deposition on flexible polyimide substrate using spray pyrolysis

et al. 2015

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Nanostructured indium tin oxide (ITO) thin films have been grown by chemical spray pyrolysis method on flexible polyimide (PI) polymeric substrates at various temperatures (400, 450 and 500°C) using solutions of indium and tin chlorides as precursors. The composition, microstructure, surface morphology, thermal, electrical, and optical characteristics have been analysed by FT-IR, UV-Vis, X-ray diffraction, SEM, EDAX, atomic force microscopy, electrical measurements, TGA, etc. X-ray diffraction measurements employing Cu-Ka radiation showed that the ITO films were polycrystalline with a cubic bixbyite structure. An increment in average grain size, electrical conductivity and optical transmittance was observed at higher substrate temperature. ITO-coated films maintained the mechanical properties and stability of the pristine PI films. The adhesion between surface ITO layers and PI matrix was found acceptable. Graphical Abstract

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Properties of Indium Tin Oxide Thin Films Deposited on Polymer Substrates

Cited by 43 publications

References 27 publications

Study of influence of sulfurisation temperature on the resistivity and surface morphology of thermally evaporated CuAlS2 thin films

Study of influence of sulfurisation temperature on the resistivity and surface morphology of thermally evaporated CuAlS2 thin films

Surface plasmon resonance in nanostructured Ag incorporated ZnS films

Study of conducting ITO thin film deposition on flexible polyimide substrate using spray pyrolysis

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