2002
DOI: 10.1016/s0168-583x(01)01002-3
|View full text |Cite
|
Sign up to set email alerts
|

Prospects of ion projection techniques for maskless implantation at high ion energies

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
2
0

Year Published

2002
2002
2019
2019

Publication Types

Select...
4
1

Relationship

0
5

Authors

Journals

citations
Cited by 7 publications
(2 citation statements)
references
References 18 publications
0
2
0
Order By: Relevance
“…High positioning accuracy can only be achieved using ≈sub‐50 keV kinetic energies, to limit the ion straggling to few tens of nanometers . Sub‐100 nm positioning is highly challenging for general‐purpose accelerators equipped with conventional electromagnetic focusing and scanning systems and it is a demanding task even for keV FIBs, which demonstrated noteworthy results following the development of ad‐hoc experimental setups . FIB systems are sensitive to chromatic aberrations, resulting in a limited number of available ion sources and energies .…”
Section: Deterministic Placement Of Color Centersmentioning
confidence: 99%
“…High positioning accuracy can only be achieved using ≈sub‐50 keV kinetic energies, to limit the ion straggling to few tens of nanometers . Sub‐100 nm positioning is highly challenging for general‐purpose accelerators equipped with conventional electromagnetic focusing and scanning systems and it is a demanding task even for keV FIBs, which demonstrated noteworthy results following the development of ad‐hoc experimental setups . FIB systems are sensitive to chromatic aberrations, resulting in a limited number of available ion sources and energies .…”
Section: Deterministic Placement Of Color Centersmentioning
confidence: 99%
“…A beam of 2 MeV N + ions with diameter 0.3µm has been imaged on the sample. The N + beam is produced by the dynamitron tandem accelerator in Bochum (DTL) and focused using a highenergy ion projector equipped with a 15 T superconducting solenoid lens 11 . The regular pattern of implantation sites visible in Fig.…”
mentioning
confidence: 99%