Prototyping memristors in digital system with an FPGA-based testing environment

Wust, Daniel; Biglari, Mehrdad; Kncodtel, Johannes; Reichenbach, Marc; Soll, Christopher; Fey, Dietmar

doi:10.1109/patmos.2017.8106978

Cited by 4 publications

(1 citation statement)

References 14 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In response to this trend, several designs have been dedicated to the testing systems for general electronic devices or specific devices such as RRAM. [20] developed a field programmable gate array (FPGA) based memristor prototyping environment, but with a maximum theoretical resolution of 740 pA, this system cannot deliver more detailed characterisation tasks. [10] implemented a microcontroller-based advance testing system for memristor devices, but the parallelism is limited.…”

Section: Introductionmentioning

confidence: 99%

An FPGA-based System for Generalised Electron Devices Testing

Foster¹,

Huang²,

Serb³

et al. 2022

Preprint

View full text Add to dashboard Cite

Electronic systems are becoming more and more ubiquitous as our world digitises. Simultaneously, even basic components are experiencing a wave of improvements with new transistors, memristors, voltage/current references, data converters, etc, being designed every year by hundreds of R&D groups world-wide. To date, the workhorse for testing all these designs has been a suite of lab instruments including oscilloscopes and signal generators, to mention the most popular. However, as components become more complex and pin numbers soar, the need for more parallel and versatile testing tools also becomes more pressing. In this work, we describe and benchmark an FPGA system developed that addresses this need. This general purpose testing system features a 64-channel source-meter unit (SMU), and 2x banks of 32 digital pins for digital I/O. We demonstrate that this bench-top system can obtain 170 pA current noise floor, 40 ns pulse delivery at ±13.5 V and 12 mA maximum current drive/channel. We then showcase the instrument's use in performing a selection of three characteristic measurement tasks: a) current-voltage (IV) characterisation of a diode and a transistor, b) fully parallel read-out of a memristor crossbar array and c) an integral non-linearity (INL) test on a DAC. This work introduces a down-scaled electronics laboratory packaged in a single instrument which provides a shift towards more affordable, reliable, compact and multi-functional instrumentation for emerging electronic technologies.

show abstract

Section: Introductionmentioning

confidence: 99%

An FPGA-based System for Generalised Electron Devices Testing

Foster¹,

Huang²,

Serb³

et al. 2022

Preprint

View full text Add to dashboard Cite

show abstract

An FPGA-based system for generalised electron devices testing

Foster

Huang

Serb

et al. 2022

Sci Rep

View full text Add to dashboard Cite

Electronic systems are becoming more and more ubiquitous as our world digitises. Simultaneously, even basic components are experiencing a wave of improvements with new transistors, memristors, voltage/current references, data converters, etc, being designed every year by hundreds of R &D groups world-wide. To date, the workhorse for testing all these designs has been a suite of lab instruments including oscilloscopes and signal generators, to mention the most popular. However, as components become more complex and pin numbers soar, the need for more parallel and versatile testing tools also becomes more pressing. In this work, we describe and benchmark an FPGA system developed that addresses this need. This general purpose testing system features a 64-channel source-meter unit, and $$2\times $$ 2 × banks of 32 digital pins for digital I/O. We demonstrate that this bench-top system can obtain $${170}\,\hbox {pA}$$ 170 pA current noise floor, $${40}\,\hbox {ns}$$ 40 ns pulse delivery at $$\pm {13.5}\,\hbox {V}$$ ± 13.5 V and $${12}\,\hbox {mA}$$ 12 mA maximum current drive/channel. We then showcase the instrument’s use in performing a selection of three characteristic measurement tasks: (a) current–voltage characterisation of a diode and a transistor, (b) fully parallel read-out of a memristor crossbar array and (c) an integral non-linearity test on a DAC. This work introduces a down-scaled electronics laboratory packaged in a single instrument which provides a shift towards more affordable, reliable, compact and multi-functional instrumentation for emerging electronic technologies.

show abstract