The US military budget restructuring to reduce costs plus the drive towards factory-to-field commonality for major new p g r a m s such as the US Air Force F-22 Advanced Tactical ighter (ATF) and the US Army RAH-66 Light Helicopter (LH) have emphasized the need for "common" test programs for manufacturing and depot Automated Test Equipment. The objectives of test program commonality are: (1) to reduce test development costs by incrementally designing the test program one time instead of 2 to 4 times by current processes; and (2) to im rove performance of the test program sets both in manutcturing, with early use of diagnostics, and the field, with diagnostics maturation and reduction of factory to field coneof-tolerance problems.