2015
DOI: 10.1364/ao.55.0000a1
|View full text |Cite
|
Sign up to set email alerts
|

Proximity-effect correction for 3D single-photon optical lithography

Abstract: A proximity-effect-correction (PEC) algorithm for three-dimensional (3D) single-photon gray-scale photolithography is proposed and numerically analyzed in this paper. The gray-scale dose assigned to every point within the photoresist volume is optimized to guarantee that the fabricated 3D patterns are as close to the designed patterns as possible. PEC optimizations for 3D woodpile geometries using low and high absorption photoresist are simulated. Spatial resolution of the proposed PEC algorithm is numerically… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2017
2017
2022
2022

Publication Types

Select...
3
1
1

Relationship

0
5

Authors

Journals

citations
Cited by 7 publications
(2 citation statements)
references
References 19 publications
0
2
0
Order By: Relevance
“…When simultaneously exposing several spots, this effect is exacerbated and different local TPP thresholds are observed, for example, at the center and in the corner of a write spot array. This effect is attributed to diffusion phenomena [15,16,20,21] and has already been observed for conventional single photon polymerization [22] as well as in DLW, both with low one-photon absorption (LOPA) [23] and two-photon absorption [15,16]. It has even been already taken advantage of to improve surface smoothness [24].…”
Section: Introductionmentioning
confidence: 73%
See 1 more Smart Citation
“…When simultaneously exposing several spots, this effect is exacerbated and different local TPP thresholds are observed, for example, at the center and in the corner of a write spot array. This effect is attributed to diffusion phenomena [15,16,20,21] and has already been observed for conventional single photon polymerization [22] as well as in DLW, both with low one-photon absorption (LOPA) [23] and two-photon absorption [15,16]. It has even been already taken advantage of to improve surface smoothness [24].…”
Section: Introductionmentioning
confidence: 73%
“…It has even been already taken advantage of to improve surface smoothness [24]. Although it has occasionally been highlighted in articles dealing with DLW, proposing tracks to correct it mainly with dynamic irradiation power control [15,16,22,23,[25][26][27], its precise and quantitative characterization is scarce and has, to our knowledge, never been reported in detail for parallel plotting. It has also recently been identified as a key difficulty that must be overcome to enable significant parallelization speed improvements through the use of large numbers of closely spaced write spots [13].…”
Section: Introductionmentioning
confidence: 99%