Pseudorandom-pattern test resistance in high-performance DSP datapaths

Abstract

The testability of basic DSP datapath structures using pseudorandom built-in self-test

Test quality and fault risk in digital filter datagraph BIST

“…However, it has been shown that these tests can be seriously flawed in the sense that some of the faults that are left untested can be relatively easy to trigger during normal operation of the device [1]. Such flaws can often be traced to some fundamental problem in the test generator, such as correlation properties that are incompatible with the device under test [1,2]. In many cases, these deficiencies can be overcome to some extent with the use of decorrelating cir-This work was conducted at the University of California at San Diego and was supported in part by grants from the Semiconductor Research Corporation (contract DJ-538), the University of California MICRO Program, and Hughes.…”

Test quality and fault risk in digital filter datapath BIST

“…In earlier work, the input conditions necessary for asserting "difficult" tests at the upper bits of an adder were derived [2]; these are repeated here in Table 1. These tests can be mapped to the corresponding numbered regions in Figure 3(a).…”

“…Where there are testability problems, it is common to find , although this relationship can vary with input spectrum, and even reverse at certain input frequencies, depending on À and À . The difference between input variances is referred to as the variance gap [2,5].…”

“…However, it has been shown that these tests can be seriously flawed in the sense that some of the faults that are left untested can be relatively easy to trigger during normal operation of the device [1]. Such flaws can often be traced to some fundamental problem in the test generator, such as correlation properties that are incompatible with the device under test [1,2]. In many cases, these deficiencies can be overcome to some extent with the use of decorrelating cirThis work was conducted at the University of California at San Diego and was supported in part by grants from the Semiconductor Research Corporation (contract DJ-538), the University of California MICRO Program, and Hughes.…”