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In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits that need to be flipped in the current test data slice in order to obtain the mutated subsequent test data slice. Exploitation of the overlap in the encoded data by effective traversal search algorithms results in drastic overall compression. The technique we propose can be utilized as not only a stand-alone technique but also can be utilized on test data already compressed, extracting even further compression. The performance of the algorithm is mathematically analyzed and its merits experimentally confirmed on the larger examples of the ISCAS'89 benchmark circuits.

A methodology for the determination of decompression hardware that guarantees complete fault coverage for a unified compaction/compression scheme is proposed. Test cube information is utilized for the determination of a near optimal decompression hardware. The proposed scheme attains simultaneously high compression levels and reduced pattern counts through a linear decompression hardware. Significant test volume and test application time reductionsare delivered through the scheme we propose while a highly cost effective hardware implementation is retained.

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Scan-based designs are widely used to decrease the complexity of the test generation process; nonetheless, they increase test time and volume. A new scan architecture is proposed to reduce test time and volume while retaining the original scan input count. The proposed architecture allows the use of the captured response as a template for the next pattern with only the necessary bits of the captured response being updated while observing the full captured response. The theoretical and experimental analysis promises a substantial reduction in test cost for large circuits.