1995
DOI: 10.1007/bf00352131
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Pyrosol deposition of fluorine-doped tin dioxide thin films

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Cited by 34 publications
(8 citation statements)
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“…The decrease in the sheet resistance with an increase in lm thickness is consistent with previous reports for undoped and doped SnO 2 lms. [15][16][17] Fig. 4b shows the variation in Hall mobility and carrier density with the sheet resistance.…”
Section: Structural and Electrical Propertymentioning
confidence: 99%
See 1 more Smart Citation
“…The decrease in the sheet resistance with an increase in lm thickness is consistent with previous reports for undoped and doped SnO 2 lms. [15][16][17] Fig. 4b shows the variation in Hall mobility and carrier density with the sheet resistance.…”
Section: Structural and Electrical Propertymentioning
confidence: 99%
“…19 This might be due to the different deposition conditions, i.e., the temperature and time of the lm. 16 The lms have a high degree of crystallinity with low sheet resistance when deposited at a higher temperature (500 C) and longer deposition time (20 minutes) but the lm begins to form an amorphous texture with a higher sheet resistance at a lower deposition temperature and shorter deposition time. The relationship between the deposition conditions and the charge concentrations seems to be related to the results of the phase analysis in the XRD.…”
Section: Structural and Electrical Propertymentioning
confidence: 99%
“…The R h , has not yet attracted much attention because of its direct proportionality to the sheet resistance of the TCO. It can be controlled by controlling the thickness of the fluorine-doped tin oxide (SnO 2 :F) film on the glass substrate, the substrate temperature at SnO 2 :F deposition [5,12,13], the thickness of the metal grid that is deposited on the FTO glass substrate [14], the thicknesses of the non-noble metals (Ni, Cu, and Al), which are deposited on the FTO glass substrate by dc magnetron sputtering [7]. However, increasing the thickness of SnO 2 :F can reduce the transmittance of TCO [5].…”
Section: Introductionmentioning
confidence: 99%
“…In 30 minutes of deposition a film of ~750nm, as measured by a Dektak profilometer, was formed from a starting solution of 0.1M Zn(Ac) 2 . The perpendicular to substrate growth of "cauliflower" like structures [3] shows the growth characteristics of ZnO which is know to have many orientations [4] especially when deposited from an aqueous environment.…”
Section: Resultsmentioning
confidence: 99%