2012
DOI: 10.3762/bjnano.3.18
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qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

Abstract: SummaryMagnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the alignment of the individual atomic magnetic moments. It is desirable to be able to image both individual atoms and domain structures with a single probe. However, the force gradients of the interactions responsible for atomic contrast and those causing domain contrast a… Show more

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Cited by 20 publications
(18 citation statements)
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“…21,22 The sensors had a characteristic resonance frequency of f 0 = 32768 Hz and a stiffness 8 measuring more than one sample per preparation condition. However, to be sure that we would not measure any outlier, the layer built-up of the AFM samples was performed in the SPR measuring cell.…”
Section: Quartz Cantilever Atomic Force Microscopy (Afm)mentioning
confidence: 99%
“…21,22 The sensors had a characteristic resonance frequency of f 0 = 32768 Hz and a stiffness 8 measuring more than one sample per preparation condition. However, to be sure that we would not measure any outlier, the layer built-up of the AFM samples was performed in the SPR measuring cell.…”
Section: Quartz Cantilever Atomic Force Microscopy (Afm)mentioning
confidence: 99%
“…One prong of the QTF (type E158 from Nanosurf AG, Liestal, Switzerland) was glued with Torr Seal on an L-shaped sapphire piece, which was in turn mounted by the same glue on a dither piezo plate. This type of QTF with one prong being fixed is often called qPlus QTF [ 31 33 ]. Another sapphire piece was sandwiched between the dither piezo and the base of the apparatus for good isolation.…”
Section: Methodsmentioning
confidence: 99%
“…Recently, quartz tuning forks (QTF) have been widely used as force sensors in scanning probe microscopes such as the atomic force microscope (AFM) and magnetic force microscope [ 29 – 31 ], in which the frequency shift of the QTFs is detected to measure the interaction between tip and sample.…”
Section: Introductionmentioning
confidence: 99%
“…For a qPlus sensor there is no restriction of the tip. In general every tip material and tip geometry is possible (Giessibl, 2003;Pielmeier & Giessibl, 2013;Schneiderbauer et al, 2012;Wastl et al, 2013bWastl et al, , 2014Wastl et al, , 2015Wastl, Speck, Wutscher, & Ostler, 2013c). This opens the way for a huge variety of different experiments and allows a much more precise adaption of the measurements to different problems (Pielmeier & Giessibl, 2013;Wastl et al, 2013aWastl et al, , 2013bWastl et al, , 2014.…”
Section: Ambient Conditions: Definition Challenges and Sensorsmentioning
confidence: 99%