2010
DOI: 10.1063/1.3272709
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Quality control of polymer solar modules by lock-in thermography

Abstract: We have characterized lateral imperfections of photovoltaic modules based on solution processed polymer-fullerene semiconductor blends by means of lock-in thermography (LIT). The active layer of the solar cell modules is based on the heterogeneous organic semiconductor system poly(3-hexylthiophene):phenyl-C61-butyric acid methyl ester and the power conversion efficiency of the modules reached nearly 2% under irradiation of an AM 1.5 solar simulator. Applying highly sensitive LIT allowed us to detect several ki… Show more

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Cited by 52 publications
(32 citation statements)
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“…Beyond the similar electrical characteristics of shunt currents, the statistical and spatial distribution of shunts also exhibits certain common features. In the literature there is considerable evidence from thermography 47,48 and luminescence 49 experiments demonstrating the localized nature of dark current conduction. Moreover, this localized conduction has also been correlated with the random shunt currents in the solar cell.…”
Section: B Physical Originmentioning
confidence: 99%
“…Beyond the similar electrical characteristics of shunt currents, the statistical and spatial distribution of shunts also exhibits certain common features. In the literature there is considerable evidence from thermography 47,48 and luminescence 49 experiments demonstrating the localized nature of dark current conduction. Moreover, this localized conduction has also been correlated with the random shunt currents in the solar cell.…”
Section: B Physical Originmentioning
confidence: 99%
“…Furthermore, the dissipative loss patterns are the origin of respective heat patterns, which are visible in dark lock-in thermography imaging experiments. Thermographic imaging is excellently suitable to represent the aforementioned losses under operating conditions [1][2][3]. Remarkable agreement was found between the experimental and calculated thermography results in defect-free solar cells.…”
Section: Extended Abstractmentioning
confidence: 55%
“…LIT have been used to image modules [106,107] while a combination of DLIT, PL, EL and reflectance imaging have successfully been used to identify defects in R2R printed modules [108]. However, of these methods only the optical reflectance inspection is suitable for high speed in-line characterization due to the long measurement times needed for the other methods.…”
Section: Imaging Of Modulesmentioning
confidence: 99%