2020
DOI: 10.1039/d0ja00281j
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Quantification of discharge gas to optimize discharge parameters for relative sensitivity factors (RSFs) determination by slow-flow glow discharge mass spectrometry (GDMS)

Abstract: Accurate determination of impurities present in a matrix by glow discharge mass spectrometry (GDMS) requires the use of relative sensitivity factors (RSFs). In general, RSFs are obtained from reference materials...

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Cited by 3 publications
(2 citation statements)
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“…Several methods such as reference data, calculated values have been utilized to obtain RSF values. [17][18][19][20][21] Our group have developed the universal RSFs (u-RSFs) by averaging RSFs from up to seven types of matrix, and applied them to the measurement of vanadium metal. 22 It was challenging to quantify the impurity elements in LaNi5 by GDMS in lack of the matrix-matched standards.…”
Section: Rsf=mentioning
confidence: 99%
“…Several methods such as reference data, calculated values have been utilized to obtain RSF values. [17][18][19][20][21] Our group have developed the universal RSFs (u-RSFs) by averaging RSFs from up to seven types of matrix, and applied them to the measurement of vanadium metal. 22 It was challenging to quantify the impurity elements in LaNi5 by GDMS in lack of the matrix-matched standards.…”
Section: Rsf=mentioning
confidence: 99%
“…Paudel and Sabatino studied the impact of changes in current, voltage and argon flow on the determination of 16 elements in silicon pressed onto an indium sheet. 145 The variation in argon flow was quantified along with impurity elements to identify a range of discharge conditions where the deviation is minimum. Further, the discharge settings leading to an optimum crater in a flat silicon sample were also considered before finalizing the optimum discharge parameters for RSF determination.…”
Section: Inorganic Chemicals and Materialsmentioning
confidence: 99%