Quantifying surface topography and scanning probe image reconstruction

Abstract

Articles you may be interested inMetrological large range scanning probe microscope Rev. Sci. Instrum. 75, 962 (2004); 10.1063/1.1651638 Quantitative method of image analysis when drift is present in a scanning probe microscope Scanning probe microscopy ͑SPM͒ is used widely for the characterization of topographic structure in both material and bio-sciences. However, due to the finite size of the imaging tip, the SPM may not record all of the surface. Dimensional measurements made on such surfaces will not reflect the true nature of the surface. Simulated images have been used to assess the effects of imaging and image reconstruction methods on surface roughness and dimensional measurements. A novel combination of image reconstruction techniques and connectivity criteria is used to set bounds on the certainty of dimensional and topographic measures and to obtain more information about the spatial complexity of the sample surface. A more complete description of the sample is obtained without prior knowledge of the sample or tip geometry.

Hydrogel Contact Lenses Surface Roughness and Bacterial Adhesion

“…This difference between techniques could be related to the effect of the measured area size on the Ra and Rms values, as they tend to be higher when the analyzed area increases (Hinojosa and Reyes, 2001;kiely and Bonnell, 1997;Kitching et al, 1999).…”

“…Rms is the standard deviation from the mean surface plane. Although Ra and Rms seem to be the most informative and consistent parameters used to define the surface topography of contact lenses (Gonzalez-Meijome et al, 2006a), they both show a dependency on sample length (Hinojosa Rivera and Reyes Melo, 2001;Kiely and Bonnell, 1997;Kitching et al, 1999). Degree of their variation with sample length could be representative of how homogeneous a surface is in its irregularities distribution.…”

“…The issue of measurement area is an important point to be considered in all surface roughness measurements (Bennett, 1992;Blunt, 2006;Hinojosa and Reyes, 2001;kiely and Bonnell, 1997;Kitching et al, 1999). WLOP allows analysing larger areas than other techniques used before in CL.…”

“…As commented previously, the apparent surface roughness depends upon the size of the sample area, so in order to provide a better description of the surface roughness, measurements must be acquired for a variety of sample sizes (Kiely and Bonnell, 1997;Kitching et al, 1999); with roughness parameters being calculated for areas with different location and size.…”

“…Moreover roughness varies with magnification, so the size of the measured area must be considered when comparing the results of different studies (Kiely and Bonnell, 1997;Kitching et al, 1999). Ra is the arithmetic mean of the departures of the profile from the mean line (Hinojosa Rivera and Reyes Melo, 2001).…”