2021
DOI: 10.1039/d0nr08768h
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Quantifying thermal transport in buried semiconductor nanostructures via cross-sectional scanning thermal microscopy

Abstract: Managing thermal transport in nanostructures became a major challenge in development of active microelectronic, optoelectronic and thermoelectric devices, stalling the famous Moore’s law of clock speed increase of microprocessors for...

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Cited by 15 publications
(43 citation statements)
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“…As the heat spreading in the layered sample on a substrate is directly affected by the anisotropy of its thermal conductivity, by fitting the xSThM measured dependence of the thermal resistance on the wedge thickness, t , in the point of contact via analytical Muzychka–Spièce model, we will obtain both the in‐plane ( k xy ) and out‐of‐plane ( k z ) values of thermal conductivity. [ 33,34 ] The total thermal resistance measured, R X ( t ) is a sum of the constant thermal resistance of the probe‐sample contact, R C , and the spreading thermal resistance, R S ( t ) [ 33 ] RX(t)badbreak=RS(t)goodbreak+RC\[ \begin{array}{*{20}{c}}{{R_X}\left( t \right) = {R_S}\left( t \right) + {R_C}}\end{array} \] …”
Section: Resultsmentioning
confidence: 99%
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“…As the heat spreading in the layered sample on a substrate is directly affected by the anisotropy of its thermal conductivity, by fitting the xSThM measured dependence of the thermal resistance on the wedge thickness, t , in the point of contact via analytical Muzychka–Spièce model, we will obtain both the in‐plane ( k xy ) and out‐of‐plane ( k z ) values of thermal conductivity. [ 33,34 ] The total thermal resistance measured, R X ( t ) is a sum of the constant thermal resistance of the probe‐sample contact, R C , and the spreading thermal resistance, R S ( t ) [ 33 ] RX(t)badbreak=RS(t)goodbreak+RC\[ \begin{array}{*{20}{c}}{{R_X}\left( t \right) = {R_S}\left( t \right) + {R_C}}\end{array} \] …”
Section: Resultsmentioning
confidence: 99%
“…al. for larger systems [ 33 ] make the present technique most flexible in terms of the thickness of samples and complexity of the structures.…”
Section: Introductionmentioning
confidence: 99%
“…8 Although non-diffusive thermal transport has been observed in nanoparticles, 9,10 nanoparticle disordered lms, 11 and nanowire arrays, 12 studying thermal dynamics and discriminating between heat propagation regimes remains a big challenge, especially for nano uids. Current techniques including time-domain thermore ectance, 13 scanning thermal microscopy, 14 transient thermal grating, 15 and other microscale imaging techniques 16 are relatively complex and limited only to surface probing.…”
Section: Full Textmentioning
confidence: 99%
“…Luminescent thermometers with spatially-delayed temperature sensing were synthesized by hot-injection thermal decomposition which facilitates layer-by-layer growth of the UCNPs and allows to place Ln 3+ dopants at the designated positions, henceforth thermometric layers (Supplementary Section I, Figs. [1][2][3][4][5][6][7][8][9][10][11][12][13][14]. Er 3+ ,Yb 3+ and Tm 3+ ,Yb 3+ co-dopants were rationally introduced in the NaGdF 4 host (Fig.…”
Section: Full Textmentioning
confidence: 99%
“…With the use of a diffusive thermal transport model for layered material on a substrate, we express R s as a function of the layer thickness and the thermal conductivities of the substrate and the material. 19,[23][24][25][26] By fitting the data for each temperature we extract the cross-plane (k c ) and in-plane (k i ) thermal conductivity (see Experimental section and ESI note 3 † for more details on the modelling, fitting procedure and accuracy).…”
mentioning
confidence: 99%