Quantitative analysis in confocal micro-PIXE—general concept and layered materials

Sokaras, Dimosthenis; Karydas, A. G.; Malzer, Wolfgang; Schütz, R.; Kanngießer, Birgit; Grlj, Nataša; Pelicon, Primož; Žitnik, M.

doi:10.1039/b817100a

Cited by 14 publications

(14 citation statements)

References 32 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…They calculated the contribution from enhancements effects to the overall confocal X-ray intensity profiles for typical samples. In another article by Sokaras et al 70 a theoretical model of the elemental profiles obtained by confocal m-PIXE was discussed in detail. Layered as well as concentrationgradient samples were investigated and the advantages and limitations of the technique were explained based on these examples.…”

Section: Spectrum Analysis Matrix Correction and Calibration Proceduresmentioning

confidence: 99%

Atomic spectrometry update–X-ray fluorescence spectrometry

West

Ellis

Potts

et al. 2010

J. Anal. At. Spectrom.

View full text Add to dashboard Cite

Section: Spectrum Analysis Matrix Correction and Calibration Proceduresmentioning

confidence: 99%

Atomic spectrometry update–X-ray fluorescence spectrometry

West

Ellis

Potts

et al. 2010

J. Anal. At. Spectrom.

View full text Add to dashboard Cite

“…The examination of the chemical composition of individual layers as well as the determination of their thickness and mass density provides information on their properties and functions. For quantification of such as these, some analytical equations based on a fundamental parameter model were proposed. There are also approaches accounting for an enhancement effect due to secondary fluorescence within multi‐layered materials examined in confocal geometry.…”

Section: Introductionmentioning

confidence: 99%

The perspective of new multi‐layer reference materials for confocal 3D micro X‐ray fluorescence spectroscopy

Czyzycki

Wróbel

Szczerbowska-Boruchowska

et al. 2012

X-Ray Spectrometry

View full text Add to dashboard Cite

Multi‐layered components are commonly used in hi‐tech branches of modern industry. This fact generates a need for suitable reference materials for experimental examination of such specimens, and it also induces the development of mathematical procedures for quantification. To reveal experimentally the chemical composition of (multi‐)layered specimens in 3D space in a non‐destructive way, a confocal 3D micro X‐ray fluorescence spectroscopy (3D μXRF) can be employed. The scope of this paper covers preparation, preliminary experimental examination and quantification of new, multi‐layer stack systems as the perspective of reference materials to be used in 3D μXRF spectroscopy. The prepared stacks consist of nine individual layers based on a low‐Z organic matrix loaded alternately with Cu2O and ZnO oxides. The stacks are characterized by the homogeneous areal distribution of inorganic fillers and the constant thickness of distinguishable layers to the extent of millimeters. A Monte Carlo (MC) simulation was used to reconstruct the chemical composition, mass density and thickness of individual layers within the stacks. Results of the simulation accurately reflected the nominal mass shares of fillers and the thickness of layers additionally determined by optical microscopy and 2D μXRF scanning. The prepared stack systems seem to be suitable materials for the validation of mathematical procedures for the quantification of multi‐layer specimens examined by depth‐sensitive X‐ray techniques. Copyright © 2012 John Wiley & Sons, Ltd.

show abstract

“…But this model treats only primary fluorescence. Sokaras et al [20] and Sokaras with Karydas [21] developed theoretical models for 3D µXRF and 3D µPIXE, respectively, taking an enhancement effect (secondary fluorescence) into account in stratified materials. However, these models are based on multidimensional integrals, which must be computed with numerical methods.…”

Section: Introductionmentioning

confidence: 99%

“…Several analytical expressions, based on the fundamental parameter approach, describing XRF peak intensity collected in 3D confocal mode, were proposed 3, 19–23. However, these relations suffered from some restrictions and limitations.…”

Section: Introductionmentioning

confidence: 99%

Monte Carlo simulation code for confocal 3D micro‐beam X‐ray fluorescence analysis of stratified materials

et al. 2011

View full text Add to dashboard Cite

Stratified materials are of great importance for many branches of modern industry, e.g. electronics or optics and for biomedical applications. Examination of chemical composition of individual layers and determination of their thickness helps to get information on their properties and function. A confocal 3D micro X-ray fluorescence (3D µXRF) spectroscopy is an analytical method giving the possibility to investigate 3D distribution of chemical elements in a sample with spatial resolution in the micrometer regime in a non-destructive way. Thin foils of Ti, Cu and Au, a bulk sample of Cu and a three-layered sandwich sample, made of two thin Fe/Ni alloy foils, separated by polypropylene, were used as test samples. A Monte Carlo (MC) simulation code for the determination of elemental concentrations and thickness of individual layers in stratified materials with the use of confocal 3D µXRF spectroscopy was developed. The X-ray intensity profiles versus the depth below surface, obtained from 3D µXRF experiments, MC simulation and an analytical approach were compared. Correlation coefficients between experimental versus simulated, and experimental versus analytical model X-ray profiles were calculated. The correlation coefficients were comparable for both methods and exceeded 99%. The experimental X-ray intensity profiles were deconvoluted with iterative MC simulation and by using analytical expression. The MC method produced slightly more accurate elemental concentrations and thickness of successive layers as compared to the results of the analytical approach. This MC code is a robust tool for simulation of scanning confocal 3D µXRF experiments on stratified materials and for quantitative interpretation of experimental results.

show abstract

Quantitative analysis in confocal micro-PIXE—general concept and layered materials

Cited by 14 publications

References 32 publications

Atomic spectrometry update–X-ray fluorescence spectrometry

Atomic spectrometry update–X-ray fluorescence spectrometry

The perspective of new multi‐layer reference materials for confocal 3D micro X‐ray fluorescence spectroscopy

Monte Carlo simulation code for confocal 3D micro‐beam X‐ray fluorescence analysis of stratified materials

Contact Info

Product

Resources

About