2022
DOI: 10.1111/jmi.13148
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Quantitative analysis of backscattered‐electron contrast in scanning electron microscopy

Abstract: Backscattered-electron scanning electron microscopy (BSE-SEM) imaging is a valuable technique for materials characterisation because it provides information about the homogeneity of the material in the analysed specimen and is therefore an important technique in modern electron microscopy. However, the information contained in BSE-SEM images is up to now rarely quantitatively evaluated. The main challenge of quantitative BSE-SEM imaging is to relate the measured BSE intensity to the backscattering coefficient … Show more

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Cited by 8 publications
(1 citation statement)
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“…This atomic number contrast provides tremendous value in detecting elements in samples containing a variety of chemical compositions. Elements with higher atomic numbers appear brighter in BSE images, while a darker appearance represents an element with a lower atomic number [56][57][58][59]. This feature is especially helpful for mineralogists and geologists because it allows the identification of various mineral phases present in a rock sample.…”
Section: Imaging Process In the Semmentioning
confidence: 99%
“…This atomic number contrast provides tremendous value in detecting elements in samples containing a variety of chemical compositions. Elements with higher atomic numbers appear brighter in BSE images, while a darker appearance represents an element with a lower atomic number [56][57][58][59]. This feature is especially helpful for mineralogists and geologists because it allows the identification of various mineral phases present in a rock sample.…”
Section: Imaging Process In the Semmentioning
confidence: 99%