2002
DOI: 10.1002/sia.1233
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Quantitative analysis of conductive coatings by radiofrequency‐powered glow discharge optical emission spectrometry: hydrogen, d.c. bias voltage and density corrections

Abstract: Radiofrequency-powered glow discharge optical emission spectrometry (rf-GDOES INTRODUCTIONGlow discharge optical emission spectrometry (GDOES) has emerged as a major technique for surface and depth profile analysis, owing to the unique combination of fast sputtering rate, high depth resolution, excellent sensitivity and multi-element capability. Although direct current (d.c.) glow discharges sources are widely used for the analysis of metallic coatings, the more recent radiofrequency (r.f.) GD sources offer th… Show more

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Cited by 43 publications
(26 citation statements)
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“…For hydrogen, the expressions in Eqns (4)- (8) can be multiplied by a hydrogen correction term. 9 A property noticed some years ago, 13,14 but not exploited to date, is that at constant pressure the emission yield appears not to vary significantly with varying power. As the power is increased, both current and voltage increase, and the increase in emission yield due to increasing current is offset by a decrease in emission yield due to the increasing voltage.…”
Section: Relative Emission Yieldmentioning
confidence: 97%
“…For hydrogen, the expressions in Eqns (4)- (8) can be multiplied by a hydrogen correction term. 9 A property noticed some years ago, 13,14 but not exploited to date, is that at constant pressure the emission yield appears not to vary significantly with varying power. As the power is increased, both current and voltage increase, and the increase in emission yield due to increasing current is offset by a decrease in emission yield due to the increasing voltage.…”
Section: Relative Emission Yieldmentioning
confidence: 97%
“…The measurement conditions used were 650 Pa and 35 W, with a copper anode of 4 mm of diameter [20]. For this characterization, coatings deposited on Ti6Al4V samples were employed.…”
Section: Coatings Characterizationmentioning
confidence: 99%
“…A high depth resolution (up to 20 nm) is a feature of GD‐OES as well, a method which simultaneously detects up to 52 elements (Horiba Jobin Yvon/JY 5000 rf) at a detection limit of about 1–10 ppm . It was applied to perform high resolution depth profiling analysis on second and third generation PV devices.…”
Section: Glow Discharge Optical Emission Spectrometrymentioning
confidence: 99%