2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) 2017
DOI: 10.1109/pvsc.2017.8366338
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Quantitative analysis of electroluminescence and infrared thermal images for aged monocrystalline silicon photovoltaic modules

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Cited by 6 publications
(6 citation statements)
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“…Operation in the fourth quadrant in dark conditions is applied to perform electroluminescence imaging of the PV module [ 29 ]. In this case, the module is forward biased with a power supply, to achieve a current similar to the Isc of the module.…”
Section: Methodsmentioning
confidence: 99%
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“…Operation in the fourth quadrant in dark conditions is applied to perform electroluminescence imaging of the PV module [ 29 ]. In this case, the module is forward biased with a power supply, to achieve a current similar to the Isc of the module.…”
Section: Methodsmentioning
confidence: 99%
“…Although it has been traditionally applied only with the PV plant in operation, which has the great advantage of not losing energy, it can also be applied while injecting current to the modules in the fourth quadrant, simultaneously or subsequent to EL inspections. Some authors term these two kinds of thermographic inspections as outdoor (illuminated) and indoor (dark) conditions, respectively [ 10 , 27 , 28 , 29 , 30 ]. However, novel research in PV systems propose the use of a power inverter with bidirectional power flow capability for utility-scale PV plants maintenance, using the EL technique, together with the flexibility provided by this type of devices [ 19 ].…”
Section: Introductionmentioning
confidence: 99%
“…It is a non-destructive measurement technique, which provides fast, real-time and two-dimensional distributions of characteristic features from PV modules [17][18][19]. In addition, IRT can be performed in illuminated or dark conditions [16,[20][21][22].…”
Section: Irt Versus El Inspectionsmentioning
confidence: 99%
“…In the EL test, modules operate under forwarding bias like a LED, and therefore have to be power supplied. The excitation current can be less than or equal to I sc [21]. It has been observed from visual inspection of EL and IR images in the fourth quadrant that most of the defects detected in the dark IRT images under the forwarding bias condition can also be identified in the EL images, whereas not all the defects detected in the EL images can be detected with dark-IRT, as some broken cells or soldering defects over one or more buses [29].…”
Section: Irt Versus El Inspectionsmentioning
confidence: 99%
“…In the EL test, modules operate under forward bias like a light emitting diode (LED), and therefore have to be power supplied. Excitation current can be lower or equal to Isc [97]. Therefore, dark-IRT can be performed simultaneously to EL test, while injecting current to the modules.…”
Section: Detection Of Pv Defectsmentioning
confidence: 99%