1998
DOI: 10.1046/j.1365-2818.1998.00370.x
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Quantitative analysis of valence electron energy‐loss spectra of aluminium nitride

Abstract: The optical properties and electronic structure of aluminium nitride are determined using valence electron energy-loss spectroscopy in a dedicated scanning transmission electron microscope. Quantitative analysis of the experimental valence electron energy-loss spectra to determine the electronic structure encompasses single scattering deconvolution of the valence electron energy-loss spectra to calculate the energy-loss function, Kramers-Kronig analysis of the energy-loss function to reveal the complex dielect… Show more

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Cited by 64 publications
(45 citation statements)
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“…26 Subsequently the spectra were corrected for multiple scattering events by Fourier-logarithmic deconvolution 40 and were scaled for constant relative thickness. 31 For energies below 3.0 eV, i.e., close to the optical band gap energy of SrTiO 3 ͑3.2 eV, 41 3.1 eV Refs.…”
Section: Discussionmentioning
confidence: 99%
“…26 Subsequently the spectra were corrected for multiple scattering events by Fourier-logarithmic deconvolution 40 and were scaled for constant relative thickness. 31 For energies below 3.0 eV, i.e., close to the optical band gap energy of SrTiO 3 ͑3.2 eV, 41 3.1 eV Refs.…”
Section: Discussionmentioning
confidence: 99%
“…SSD spectra are obtained from experimental spectra by deconvolution of elastic phonon and multiple scattering effects. This is achieved by fitting the experimental zero-loss peak with a multiparameter asymmetric function 10 followed by Fourier-log deconvolution proposed by Johnson and Spence 11 and computed by Egerton. 12 The convergence angular effects are corrected using Egerton's CONCOR software.…”
Section: Methodsmentioning
confidence: 99%
“…The methods of VEELS have been discussed in detail. 24,73,74 The experimentally determined ELF is first corrected for multiple scattering effects using Fourier logarithm deconvolution, then the ELF is scaled through application of the index sum rule shown in Eq. (16), where P represents the Cauchy principal part of the integral.…”
Section: ϫ3mentioning
confidence: 99%