2015
DOI: 10.1016/j.tsf.2015.01.009
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Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy

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Cited by 9 publications
(10 citation statements)
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“…The results are shown in Figure a–f. AFM phase image offers a comprehensive details of surface mechanics, and the differences contrast revealed the states surface and aggregation induced by the evaporation processes associated with different solvents. Near‐infrared reflection was utilized in order to investigate the vertical component distribution in films, and the results were illustrated in Figure g.…”
Section: Resultsmentioning
confidence: 99%
“…The results are shown in Figure a–f. AFM phase image offers a comprehensive details of surface mechanics, and the differences contrast revealed the states surface and aggregation induced by the evaporation processes associated with different solvents. Near‐infrared reflection was utilized in order to investigate the vertical component distribution in films, and the results were illustrated in Figure g.…”
Section: Resultsmentioning
confidence: 99%
“…The methodology also can be used to study the polymer solar cells. The pending atomic force microscopy (AFM) images were delimited from previous investigation 18 which was reported ( Fig. 9b ).…”
Section: Resultsmentioning
confidence: 99%
“… 17 ; ( b ) AFM images reported by Gao et al . 18 ; ( c ) images in the biorector reported by Rodriguez et al . 19 ; ( d ) S 2 of ( a ); ( e ) S 2 of ( b ); ( f ) S 2 of ( c ).…”
Section: Figurementioning
confidence: 97%
“…In order to investigate the material-specific morphology of the BHJ, we have used atomic force microscopy (AFM) phase imaging. This approach is often employed to investigate the surface of organic BHJ solar cells. , Yet, despite numerous studies, a clear model of the material-specific BHJ morphology is still not presented. To obtain meaningful results with AFM phase imaging, special care is needed to select proper instrument settings for feedback loop as well as for strength of tip–surface interaction.…”
Section: Introductionmentioning
confidence: 99%
“…Also, important requirement for proper AFM phase image interpretation is to obtain an unambiguous identification of polymer and fullerene material. In previous studies, identification of materials by AFM phase imaging has not been reported. , Alongside with AFM, transmission electron microscopy (TEM) measurements have also been used to investigate BHJ morphology. TEM measurements have been able to identify immense fullerene aggregates due to larger electron densities. ,, However, for optimized BHJ morphologies, TEM failed to resolve structure of smaller clusters ,, most likely due to the signal integration over the film thickness.…”
Section: Introductionmentioning
confidence: 99%