2014
DOI: 10.1016/j.jpowsour.2013.11.117
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Quantitative contribution of resistance sources of components to stack performance for planar solid oxide fuel cells

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Cited by 32 publications
(15 citation statements)
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“…1 to quantitatively measure the resistance of the components in the SRUs [12,14]. The interconnect resistance was measured by leads 1e2; the contact resistance between the hydrogen electrode current-collecting layer (HECCL) and the interconnect (hydrogen electrode CR), was measured by leads 2e3; the internal resistance of the UC was measured by leads 3e4; the contact resistance between the air electrode current-collecting layer (AECCL) and the interconnect (air electrode CR), was measured by leads 4e5; and the resistance of the SUR was measured by leads 1e5 [12,15].…”
Section: Methodsmentioning
confidence: 99%
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“…1 to quantitatively measure the resistance of the components in the SRUs [12,14]. The interconnect resistance was measured by leads 1e2; the contact resistance between the hydrogen electrode current-collecting layer (HECCL) and the interconnect (hydrogen electrode CR), was measured by leads 2e3; the internal resistance of the UC was measured by leads 3e4; the contact resistance between the air electrode current-collecting layer (AECCL) and the interconnect (air electrode CR), was measured by leads 4e5; and the resistance of the SUR was measured by leads 1e5 [12,15].…”
Section: Methodsmentioning
confidence: 99%
“…Fig. 3b and c shows the variations of the ASRs of the UC, air electrode contact, hydrogen electrode contact and interconnect with time where the ASRs were measured and calculated via voltage measurements [12,15]. The air electrode CR slightly dropped within 115 h, and then continuously increased, the hydrogen electrode CR and the UC resistance continuously increased with time, and the interconnect resistance remained unchanged and negligible (0.001 U cm 2 ).…”
Section: Quantitative Contribution Of Resistance Sources To Stack Elementioning
confidence: 99%
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“…We concluded that stack performance is signifi cantly affected by cell performance itself when excellent stack sealing and contact among internal components are provided. [ 14 ] Therefore, further improvement of cell performance (i.e., reducing cell resistance) and unit cell stability is crucial for SOFC stacks.Anode-supported planar SOFCs are widely used because of their superior performance and multi-layered structure that comprises several components (supported anode, anode function layer, electrolyte, and active cathode). [ 15,16 ] Thus, a quantitative understanding of how the cell components affect cell performance can function as a guide in optimizing cell performance.…”
mentioning
confidence: 99%
“…12) It was observed that contact resistance could account for ³2030% resistance in a stack. 13) Variation of contact resistance from cell to cell in a stack could cause non-uniform power distribution over the consisting cells. 14) Silver has been considered a contact material based on its excellent electrical conductivity and low melting point (³962°C) which enhances effective sintering at SOFC operating temperatures.…”
Section: Introductionmentioning
confidence: 99%