2011
DOI: 10.1007/s10853-011-5259-4
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Quantitative mapping of surface elastic moduli in silica-reinforced rubbers and rubber blends across the length scales by AFM

Abstract: The surface elastic moduli of silica-reinforced rubbers and rubber blends were investigated by atomic force microscopy (AFM)-based HarmoniX material mapping. Styrene-butadiene rubbers (SBR) and ethylene-propylenediene rubbers (EPDM) and SBR/EPDM rubber blends with varying concentrations of silica nanoparticles (0, 5, 10, 20, 50 parts per hundred rubber, phr) were prepared to investigate the effect of different composition on the resulting morphology, filler distribution and elastic moduli of a specific rubber … Show more

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Cited by 43 publications
(19 citation statements)
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“…Isolated particle morphologies are easily detectable. AFM nano-indentation results show a higher modulus of elasticity for isolated particles than for the rubber matrix, as seen elsewhere [40][41][42]. Moreover, the mechanical response of the isolated particles did not show any significant difference when changing the loading rate during indentation, suggesting that the isolated particles are not viscoelastic.…”
Section: Resultssupporting
confidence: 63%
“…Isolated particle morphologies are easily detectable. AFM nano-indentation results show a higher modulus of elasticity for isolated particles than for the rubber matrix, as seen elsewhere [40][41][42]. Moreover, the mechanical response of the isolated particles did not show any significant difference when changing the loading rate during indentation, suggesting that the isolated particles are not viscoelastic.…”
Section: Resultssupporting
confidence: 63%
“…6(c) that the size of a single CNP is approximately 3.8 nm. The elastic property of a material is important for the stability of materials and its device fabrication, especially for nanomaterials with potential application, because the elastic property of a material determines the stability and reliability of the devices (39,40). In this context we measured structural morphology of carbon nanoparticle thin film and its corresponding elastic modulus (DMT modulus) simultaneously.…”
Section: Resultsmentioning
confidence: 99%
“…In addition to (and in conjunction with) the caveats noted above, the uncertainty is also affected by the ca. 30 percent error inherently involved in the AFM technique …”
Section: Resultsmentioning
confidence: 99%