2003
DOI: 10.1016/s0168-583x(03)01078-4
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Quantitative PIXE analysis of single fluid inclusions in quartz vein: Chemical composition of hydrothermal fluids related to granite

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Cited by 4 publications
(2 citation statements)
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“…Particle-induced X-ray emission (PIXE) has repeatedly been used to quantify element concentrations in fluid inclusions. This is a very laborious approach, and assumptions on the shape and dimensions of a given inclusion (to obtain its mass of liquid at the temperature of analysis) and on depth below sample surface lead to considerable analytical uncertainty that, in an ideal case, was claimed to be no better than ±10 % (probably 1 σ; Kurosawa et al, 2003). The determination of the Na concentration in a given fluid inclusion by combined microthermometry and salt correction based on the actual LA-ICP-MS analysis (Heinrich et al, 2003) is accurate for fluid compositions that closely correspond to pure (Na-K-Ca-Cl) solution; hence, the mean and analytical uncertainty determined on an assemblage average is representative.…”
Section: Prospectsmentioning
confidence: 99%
“…Particle-induced X-ray emission (PIXE) has repeatedly been used to quantify element concentrations in fluid inclusions. This is a very laborious approach, and assumptions on the shape and dimensions of a given inclusion (to obtain its mass of liquid at the temperature of analysis) and on depth below sample surface lead to considerable analytical uncertainty that, in an ideal case, was claimed to be no better than ±10 % (probably 1 σ; Kurosawa et al, 2003). The determination of the Na concentration in a given fluid inclusion by combined microthermometry and salt correction based on the actual LA-ICP-MS analysis (Heinrich et al, 2003) is accurate for fluid compositions that closely correspond to pure (Na-K-Ca-Cl) solution; hence, the mean and analytical uncertainty determined on an assemblage average is representative.…”
Section: Prospectsmentioning
confidence: 99%
“…Major and trace element analysis is needed to characterize them. A specific feature of the PIXE (particle Induced X-ray emission) method is its ability to analyse intra-crystalline micro-inclusions in a non-destructive way [1], [2], [3] and [4]. This is because the range of 3 MeV protons is of the order of 70 μm in silicates.…”
Section: Introductionmentioning
confidence: 99%