2015
DOI: 10.1107/s1600576715009231
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Quantitative voxel-to-voxel comparison of TriBeam and DCT strontium titanate three-dimensional data sets

Abstract: Recently, techniques for the acquisition of three-dimensional tomographic and four-dimensional time-resolved data sets have emerged, allowing for the analysis of mm 3 volumes of material with nm-scale resolution. The ability to merge multi-modal data sets acquired via multiple techniques for the quantitative analysis of structure, chemistry and phase information is still a significant challenge. Large three-dimensional data sets have been acquired by time-resolved diffraction contrast tomography (DCT) and a ne… Show more

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Cited by 31 publications
(24 citation statements)
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“…The spatial resolution of the DCT reconstruction is 1 − 2 voxels (i.e. 1.5 − 3 µm), as demonstrated previously by Ludwig et al [30] by comparison to PCT, and by Lenthe et al [32] by comparison with TriBeam.…”
Section: Methodssupporting
confidence: 69%
“…The spatial resolution of the DCT reconstruction is 1 − 2 voxels (i.e. 1.5 − 3 µm), as demonstrated previously by Ludwig et al [30] by comparison to PCT, and by Lenthe et al [32] by comparison with TriBeam.…”
Section: Methodssupporting
confidence: 69%
“…After DIC measurements were performed on the loaded samples, EBSD maps were again collected from the DIC measurement regions of interest. These EBSD maps were collected with the same parameters as described previously and were carefully aligned to the SEM DIC strain maps using affine transformation and alignment routines originally developed for merging 3-D multimodal datasets [20].…”
Section: Methodsmentioning
confidence: 99%
“…24 EBSD maps were collected from the laser machined lift-out areas using a FEI Quanta 3D FIB-SEM equipped with an EDAX Hikari XP EBSD in order to determine the grain orientations and Schmid factors of the grains contained in the TEM foils. Grain orientation information was collected with a 0.5 lm resolution at 70 tilt relative to the 25 keV electron beam operating at a 3 nA beam current.…”
Section: Methodsmentioning
confidence: 99%
“…This indicates that multiple slip systems are present in the high dislocation density regions. However, the high density of dislocations within the first 100 nm of the surface is easily removed by near glancing angle FIB milling, 24 as shown in the TEM micrographs in Figure 4(b).…”
Section: A Dislocation Analysismentioning
confidence: 99%