Scanning Electron Microscopy and X-Ray Microanalysis 1981
DOI: 10.1007/978-1-4613-3273-2_7
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Quantitative X-Ray Microanalysis

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Cited by 39 publications
(47 citation statements)
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“…The x-ray data were quantitated using the peak to background ratio (P/B) method (10). Standard element windows of 14 eV were used to integrate the area under the elemental peaks.…”
Section: Methodsmentioning
confidence: 99%
“…The x-ray data were quantitated using the peak to background ratio (P/B) method (10). Standard element windows of 14 eV were used to integrate the area under the elemental peaks.…”
Section: Methodsmentioning
confidence: 99%
“…3 Types of aberration caused in the lens [8] : (a) spherical aberration, (b) chromatic aberration, and (c) diffraction aberration 할 수 있어서 안정도가 높다는 장점을 가지고 있다 [4] . 또한 극간의 거리는 파센커브(paschen curve)를 참조하였고, 전극면을 줄여서 면적효과(area effect)를 줄임으로써, 진공 중 절연파괴를 줄일 수 있다는 보고 [5,6] 굴절하는 정도가 달라지게 되는 것이다 [7,8] . 이러한 영향들로 초점 [7,8] .…”
Section: 실험장비의 구성 및 실험방법unclassified
“…This approximation is acceptable in TEM, where accelerating voltages are typically within the range of 100-200 keV. However, it is no longer applicable at lower voltages, such as those used in a scanning electron microscope (SEM), where backscattering and high scattering angles become significant [8]. Furthermore, another drawback of diffraction simulation methods thus far is the inability to reproduce effects that result from the particle characteristics of electrons.…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore, another drawback of diffraction simulation methods thus far is the inability to reproduce effects that result from the particle characteristics of electrons. These may include secondary and backscattering coefficients, electron transport and inelastic scattering [8]. Monte Carlo simulation methods are currently used in that effect.…”
Section: Introductionmentioning
confidence: 99%