2000
DOI: 10.1107/s0021889800012036
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Quantitative X-ray standing-wave phase analysis by means of photoelectrons

Abstract: Quantitative information on a subsurface layer structure is obtained through the determination of the photoelectron escape depth by using the photoelectrons emitted by an X‐ray standing wavefield in the range of dynamical X‐ray diffraction from high‐quality crystals. A simple method to determine the mean escape depth L of low‐energy‐loss photoelectrons is proposed, based on the analysis of the phase of the X‐ray standing wavefield in a specially designed epitaxic structure grown by molecular‐beam epitaxy. The … Show more

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Cited by 24 publications
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