Quantize of scattering theory

Marghany, Maged

doi:10.1016/b978-0-12-818111-9.00005-7

Cited by 3 publications

(2 citation statements)

References 14 publications

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“…This instigates microwave absorption/energy dissipation during the rotation and orientation of the dipoles. 12 The dipoles oscillate to keep up with the changing external electric fields, and at some critical frequency, polarizability cannot be maintained, resulting in dielectric loss. At high frequencies, dielectric polarizability sets the scale for radiation absorption, while at low frequencies, it determines the nonlinear effects.…”

Section: Introductionmentioning

confidence: 99%

Dielectric spectroscopic investigation of reversible photo-induced changes in amorphous Ge2Sb2Se5 thin films

Obeng

Nguyen

Amoah

et al. 2022

Journal of Applied Physics

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Broadband dielectric spectroscopy (BDS) was used to study thin films of Ge2Sb2Se5 exposed to low fluence UV-irradiation that resulted in thermally reversible photo-induced changes (PICs) on the film surfaces. Changes were characterized by reversible changes in film morphology and changes in the microwave scattering signature prior to and following irradiation. The PIC resulting from irradiation formed a low modulus and electrically resistive layer at the film surface. Modest heating of the photo-exposed material to about 60 °C anneals out the photo-formed layer to leave behind a very thin layer of smooth, thermally stable material at the film surface. Re-exposure of the material to UV-light recreated a foamy layer, which anneals away with modest heating over several cycles. The broadband microwave insertion loss (S21) increased with the film morphology changes after UV light exposure and decreased with thermal anneal over several cycles. These changes are correlated with transformations in the film's surface morphology and possibly structural modifications in the amorphous film. Thus, the BDS analysis provided interesting new insights into the nature of photo-induced processes in chalcogenide films, such as the electrical resistance consequences of morphological/structural changes.

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Section: Introductionmentioning

confidence: 99%

Dielectric spectroscopic investigation of reversible photo-induced changes in amorphous Ge2Sb2Se5 thin films

Obeng

Nguyen

Amoah

et al. 2022

Journal of Applied Physics

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“…The applied electric field of the microwave, E, causes the dipolar moment, m, of the molecule to experience a torque, G, to orientate the dipolar moment parallel to the electric field. This instigates microwave absorption / energy dissipation during the rotation and orientation of the dipoles 9 . The dipole oscillates to keep up with the changing external magnetic fields, and at some critical frequency, the polarizability cannot be maintained, resulting in dielectric loss.…”

Section: Introductionmentioning

confidence: 99%

(Invited) Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems

Amoah¹,

Sunday²,

Okoro³

et al. 2022

ECS Trans.

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In this paper, we present an overview of our current research focus in developing non-destructive metrology for monitoring reliability issues in 3D- integrated electronic systems. We introduce a suite of non-destructive metrologies that can serve as early warning monitors for reliability issues. These Broadband Dielectric Spectroscopic (BDS) techniques are based on the application of high frequency microwaves (up to 40 GHz) to devices under various external stress, to probe impedance changes due to material and structural changes in integrated circuits. We illustrate the capabilities of the techniques with four case studies of potential reliability issues in 3D-IC interconnects.

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DFT study of chemical reactivity parameters of lithium polysulfide molecules Li2Sn(1≤n≤8) in gas and solvent phase

Cheviri

Lakshmipathi

2021

Computational and Theoretical Chemistry

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Quantize of scattering theory

Cited by 3 publications

References 14 publications

Dielectric spectroscopic investigation of reversible photo-induced changes in amorphous Ge2Sb2Se5 thin films

Dielectric spectroscopic investigation of reversible photo-induced changes in amorphous Ge2Sb2Se5 thin films

(Invited) Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems

DFT study of chemical reactivity parameters of lithium polysulfide molecules Li2Sn(1≤n≤8) in gas and solvent phase

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