In the family of functional oxide materials, the interface between LaAlO 3 and SrTiO 3 (LAO/STO) is an interesting example, as both materials are largebandgap insulators in their bulk state but give rise to a confined 2D electron gas (2DEG) when combined through thin-film deposition. While this 2DEG exhibits remarkable properties, its experimental investigation is mostly limited to destructive or non-local (i.e. averaging over larger areas) methods until recently. Scanning near-field optical microscopy is shown to overcome this limitation, detecting buried 2DEGs by using highly confined optical nearfields. Here, a full spectroscopic approach with phonon-enhancement and simulations based on the finite dipole model is combined to extract quantitative electronic properties of the interfacial LAO/STO 2DEG. This threefold improvement compared to previous work will enable the quantitative nanoscale, non-destructive, sub-surface analysis of complex oxide thin films and interfaces, as well as similar heterostructures.