QUEELS: Software to calculate the energy loss processes in TEELS, REELS, XPS and AES including effects of the core hole

Tougaard, S.; Pauly, Nicolas; Yubero, F.

doi:10.1002/sia.7095

Cited by 4 publications

(2 citation statements)

References 63 publications

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“…REELS analysis tends to be quite theoretically complex and one of the best introductions comes from Tougaard et al illustrating their data analysis software QUEELS. 69 Additional considerations/limitations: • Vacuum required.…”

Section: N Profilometrymentioning

confidence: 99%

Selecting the best surface analysis method for your materials/samples

Robinson,

Thissen

2024

Journal of Vacuum Science &Amp; Technology A

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There are a large number of surface analytical methods, each with their own strengths and limitations. This review provides tools and an amalgamated source of information to those new to surface characterization or to those who would like to select the most appropriate, commonly accessible, surface characterization technique for their sample. It includes a quick technique selection guide for narrowing down suitable methods for obtaining a range of compositional, structural, and surface properties. Considerations and recommendations for approaching instrument technicians and field experts are also discussed. To further aid in technique selection, comparative tables for complementary techniques are included in addition to case studies in technique selection and application, and finally, a brief overview of commonly employed analysis methods is provided, including related important considerations.

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Section: N Profilometrymentioning

confidence: 99%

Selecting the best surface analysis method for your materials/samples

Robinson,

Thissen

2024

Journal of Vacuum Science &Amp; Technology A

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“…The step function θ ( ħω − E g ) ( θ = 1 for

; θ = 0 for

) is included to describe the band gap energy E g in semiconductors and insulators. The parameters describing the energy loss function may be taken from the literature [ 16 , 17 ], or they can conveniently be determined from analysis of reflection electron energy loss spectroscopy (REELS) measurements [ 18 ].…”

Section: Theoretical Modelmentioning

confidence: 99%

Determination of the Primary Excitation Spectra in XPS and AES

2023

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This paper reviews a procedure that allows for extracting primary photoelectron or Auger electron emissions from homogeneous isotropic samples. It is based on a quantitative dielectric description of the energy losses of swift electrons travelling nearby surfaces in presence of stationary positive charges. The theory behind the modeling of the electron energy losses, implemented in a freely available QUEELS-XPS software package, takes into account intrinsic and extrinsic effects affecting the electron transport. The procedure allows for interpretation of shake-up and multiplet structures on a quantitative basis. We outline the basic theory behind it and illustrate its capabilities with several case examples. Thus, we report on the angular dependence of the intrinsic and extrinsic Al 2s photoelectron emission from aluminum, the shake-up structure of the Ag 3d, Cu 2p, and Ce 3d photoelectron emission from silver, CuO and CeO2, respectively, and the quantification of the two-hole final states contributing to the L3M45M45 Auger electron emission of copper. These examples illustrate the procedure, that can be applied to any homogeneous isotropic material.

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QUEELS: Software to calculate the energy loss processes in TEELS, REELS, XPS and AES including effects of the core hole

Tougaard

Pauly

Yubero

2022

Surface & Interface Analysis

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We present the user‐friendly and freely available software package QUEELS (QUantitative analysis of Electron Energy Losses at Surfaces) that allows to calculate effective inelastic scattering cross sections within the dielectric response description, for swift electrons travelling nearby surfaces in several environments. We briefly describe the underlying theoretical models and illustrate its use to evaluate the distribution of energy losses taking place in electron spectroscopies like transmission electron energy loss spectroscopy (TEELS), X‐ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and reflection electron energy loss spectroscopy (REELS), which are widely used for material analysis. This includes the intrinsic excitations due to the core hole in XPS and AES.

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QUEELS: Software to calculate the energy loss processes in TEELS, REELS, XPS and AES including effects of the core hole

Cited by 4 publications

References 63 publications

Selecting the best surface analysis method for your materials/samples

Selecting the best surface analysis method for your materials/samples

Determination of the Primary Excitation Spectra in XPS and AES

QUEELS: Software to calculate the energy loss processes in TEELS, REELS, XPS and AES including effects of the core hole

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