Abstract.Satellite remote sensing of the Earth's atmospheric composition usually samples irregularly in space and time, and many applications require spatially and temporally averaging the satellite observations (Level 2) to a regular grid (Level 3). When averaging Level 2 data over a long time period to a target Level 3 grid significantly finer than Level 2 pixels, this process is referred to as "oversampling". An agile, physics-based oversampling approach is developed to represent each satellite obser-5 vation as a sensitivity distribution on the ground, instead of a point or a polygon as assumed in previous approaches. This sensitivity distribution can be determined by the spatial response function of each satellite sensor. A generalized 2-D super Gaussian function is proposed to characterize the spatial response functions of both imaging grating spectrometers (e.g., OMI, OMPS, and TROPOMI) and scanning Fourier transform spectrometers (e.g., GOSAT, IASI and CrIS). Synthetic OMI and IASI observations were generated to compare the errors due to simplifying satellite fields of view (FOV) as polygons (tessellation 10 error) and the errors due to discretizing the smooth spatial response function on a finite grid (discretization error). The balance between these two error sources depends on the target grid resolution, the ground size of FOV, and the smoothness of spatial response functions. Explicit consideration of the spatial response function is favorable for high resolution oversampling and smoother spatial response. For OMI, it is beneficial to oversample using the spatial response functions for grid resolutions finer than ∼16 km. The generalized 2-D super Gaussian function also enables smoothing of the Level 3 results by decreasing the 15 shape-determining exponents, useful for high noise level or sparse satellite datasets. This physical oversampling is applied to OMI NO 2 products and IASI NH 3 products, showing substantially improved visualization of trace gas distribution and local gradients.1 Atmos. Meas. Tech. Discuss., https://doi