1981
DOI: 10.1070/pu1981v024n12abeh004758
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Radiation blistering

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1983
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Cited by 38 publications
(10 citation statements)
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“…This is likely to be caused by the fact that the MR potential is semiempirical and approximates the expo nential potential V ∝ exp(-R/B) (where B is a con stant) obtained in [14] from the experimental data on the threshold energies of mixing in metals. Note that all interatomic potentials used in this work are approx imated and do not take into account the shell effects during interatomic interaction [15]. Figure 3 shows the values of exponent n in the one cosine approximation of the experimental curves (Eq.…”
Section: Resultsmentioning
confidence: 98%
“…This is likely to be caused by the fact that the MR potential is semiempirical and approximates the expo nential potential V ∝ exp(-R/B) (where B is a con stant) obtained in [14] from the experimental data on the threshold energies of mixing in metals. Note that all interatomic potentials used in this work are approx imated and do not take into account the shell effects during interatomic interaction [15]. Figure 3 shows the values of exponent n in the one cosine approximation of the experimental curves (Eq.…”
Section: Resultsmentioning
confidence: 98%
“…According to the theory of blistering [1], the main parameters, which determine the threshold of blistering are: energy of ions, mechanical properties of the irradiated metal and concentration of hydrogen atoms implanted into the target. Secondary effects, which also influence the blistering threshold are accumulation of radiation damages and change of mechanical and structural properties of the target under irradiation.…”
Section: Discussionmentioning
confidence: 99%
“…Extensive studies of blistering were carried out with helium beams (see, e.g. review [1,2] and the references therein), this is the simplest case for the discussed phenomenon due to a chemical inertness of helium. The model that quantitatively describes blistering and the related processes exists [3].…”
Section: Introductionmentioning
confidence: 99%
“…Approximately uniform H-distribution profiles may be explained by constant codeposition rate during the film formation at low irradiation doses and by development of a sponge-like structure in the 300-nm nearsurface zone of mixed layers where H(D)-distribution has a table-like shape [10] at higher irradiation doses.…”
Section: Resultsmentioning
confidence: 96%