2019
DOI: 10.1016/j.microrel.2019.06.034
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Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs

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Cited by 5 publications
(1 citation statement)
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“…architecture design techniques (also known as radiation hardening by design) are key features in many embedded application domains that must employ COTS for commercial sustainability. In this context, the effective implementation of fault-tolerant soft-processor solutions in static RAM (SRAM) based FPGAs is a significant research target [7], [8].…”
Section: Introductionmentioning
confidence: 99%
“…architecture design techniques (also known as radiation hardening by design) are key features in many embedded application domains that must employ COTS for commercial sustainability. In this context, the effective implementation of fault-tolerant soft-processor solutions in static RAM (SRAM) based FPGAs is a significant research target [7], [8].…”
Section: Introductionmentioning
confidence: 99%