2020
DOI: 10.1016/j.physleta.2019.126148
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Raman-based measurement of carrier concentration in n-type ZnO thin films under resonant conditions

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Cited by 12 publications
(11 citation statements)
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“…According to the cascade model [63], impurities do not influence the second-order scattering process, but they are still affected by phonon-plasmon coupling. Therefore, the Raman shift of the 2A 1 -LO modes can be used for measurements of the charge carrier concentration [56]. In our case, the shift of the 2A 1 -LO from 1148 ± 2 to 1144 ± 2 cm −1 for the undoped and RE-doped ZnO, respectively, could be caused by an increase in the charge carrier concentration upon doping.…”
Section: Raman Spectroscopymentioning
confidence: 64%
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“…According to the cascade model [63], impurities do not influence the second-order scattering process, but they are still affected by phonon-plasmon coupling. Therefore, the Raman shift of the 2A 1 -LO modes can be used for measurements of the charge carrier concentration [56]. In our case, the shift of the 2A 1 -LO from 1148 ± 2 to 1144 ± 2 cm −1 for the undoped and RE-doped ZnO, respectively, could be caused by an increase in the charge carrier concentration upon doping.…”
Section: Raman Spectroscopymentioning
confidence: 64%
“…According to Alim et al [55], there are three main mechanisms leading to the red (downward) peak shifts of the phonon frequencies in NCs, namely, the spatial confinement within the boundaries of the nanocrystals, defects that are responsible for the phonon localization, and localized heating by the laser. Mao et al showed that for heavily doped ZnO, the first-and secondorder A 1 -LO modes are red-shifted due to phonon-plasmon coupling [56]. In the case of doping, a mass effect of foreign atoms and strain should be considered [57].…”
Section: Raman Spectroscopymentioning
confidence: 99%
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