2011 International Conference on Computer Vision 2011
DOI: 10.1109/iccv.2011.6126466
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Random ensemble metrics for object recognition

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Cited by 20 publications
(13 citation statements)
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“…Although one normal vector from support vector machine (SVM) that amounts to projecting the SPM onto 1-D subspace may be enough for the binary classification problem, it is far less enough for visual tracking due to the inherent challenges. Kozakaya et al [15] presented an ensemble metric learning scheme which learns multiple discriminative projection vectors obtained from linear SVM using randomly subsampled training data. In our work, we find a suitable metric matrix in the feature space of sparse codes via online metric learning rather than resorting to linear SVMs to adaptively capture appearance variations.…”
Section: Related Workmentioning
confidence: 99%
“…Although one normal vector from support vector machine (SVM) that amounts to projecting the SPM onto 1-D subspace may be enough for the binary classification problem, it is far less enough for visual tracking due to the inherent challenges. Kozakaya et al [15] presented an ensemble metric learning scheme which learns multiple discriminative projection vectors obtained from linear SVM using randomly subsampled training data. In our work, we find a suitable metric matrix in the feature space of sparse codes via online metric learning rather than resorting to linear SVMs to adaptively capture appearance variations.…”
Section: Related Workmentioning
confidence: 99%
“…In this paper, we learn from [10] random ensemble metrics (REMetric) method, combined with the ensemble learning based on support vector machine. Support Vector Machine (SVM) is firstly proposed by Cortes and Vapnik in 1995, which seeks to find the maximum separation hyper-plane of two categories, therefore over-fitting phenomenon is rarely seen, and it show unique advantages in pattern recognition of high dimensional feature space.…”
Section: Introductionmentioning
confidence: 99%
“…To this end, there have been increasing efforts made to learn a distance metric in recent years [6,10,37,39,41,50]. Metric learning methods can be categorized into unsupervised [50], semisupervised [5] and supervised ones [1,11,25,27,34,53], according to the availability of the labels of training samples. Metric learning has been proved to successfully improve the clustering and recognition performance in information retrieval [29,30], bioinformatics [47] and computer vision tasks [6,10,12,16,39,37].…”
Section: Introductionmentioning
confidence: 99%