2011
DOI: 10.1364/ao.50.006564
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Random-phase-shift Fizeau interferometer

Abstract: A new and potentially cost efficient kind of vibration-tolerant surface measurement interferometer based on the Fizeau-principle is demonstrated. The crucial novelty of this approach is the combination of two optoelectronic sensors: an image sensor with high spatial resolution and an arrangement of photodiodes with high temporal resolution. The photodiodes continuously measure the random-phase-shifts caused by environmental vibrations in three noncollinear points of the test surface. The high spatial resolutio… Show more

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Cited by 14 publications
(4 citation statements)
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“…In order to avoid systematic errors, any amplitude modulation must be additionally reduced by the normalization of the measured signals. An approach concerning this normalization in a different context was already published [20]. Another critical aspect is the non-sinusoidal signal component which may result from multiple reflections between the measuring object and the probe head.…”
Section: Hilbert Transform Signal Processingmentioning
confidence: 99%
“…In order to avoid systematic errors, any amplitude modulation must be additionally reduced by the normalization of the measured signals. An approach concerning this normalization in a different context was already published [20]. Another critical aspect is the non-sinusoidal signal component which may result from multiple reflections between the measuring object and the probe head.…”
Section: Hilbert Transform Signal Processingmentioning
confidence: 99%
“…In the phase shifting process, the OPD increment is very tiny, usually tens of nanometres, and therefore is easily disturbed by environmental unsteady factors. Due to the phase-shifting error caused by vibration, traditional phase extraction algorithms [1] are not suitable and researchers have developed many methods to minimise the effect of vibration on PSI, such as simultaneous phaseshifting method [2,3] and phase-shifting error detection and compensation method [4,5]. Both the two methods require modification of the interferometer and the configuration is elaborate.…”
Section: Introductionmentioning
confidence: 99%
“…Methods [1][2][3][4] were proposed to retrieve phase from interferograms with translational phase-shifting errors. Thereafter research was concentrated on relative tilt between reference and measured wavefronts, and some methods addressing it were proposed [5][6][7][8]. With tilt-shifting error compensated, the surface measurement error from phase-shifting error is well suppressed.…”
Section: Introductionmentioning
confidence: 99%