2003
DOI: 10.1107/s0021889803017564
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Rapid-acquisition pair distribution function (RA-PDF) analysis

Abstract: An image‐plate (IP) detector coupled with high‐energy synchrotron radiation was used for atomic pair distribution function (PDF) analysis, with high probed momentum transfer Qmax≤ 28.5 Å−1, from crystalline materials. Materials with different structural complexities were measured to test the validity of the quantitative data analysis. Experimental results are presented for crystalline Ni, crystalline α‐AlF3, and the layered Aurivillius type oxides α‐Bi4V2O11 and γ‐Bi4V1.7Ti0.3O10.85. Overall, the diffraction p… Show more

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Cited by 554 publications
(546 citation statements)
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“…Le Bail 38 fits to the intensity profiles were performed with GSAS 44 on the EXPGUI platform 45 . Pair distribution function (PDF) profiles were obtained by Fourier transforming the measured total scattering intensity up to a maximum momentum transfer of Q max ¼ 24 Å À 1 using established protocols 46,47 as implemented in the programme PDFgetN 48 . The Le Bail fits were used to extract lattice parameters and space-group symmetry, the PDF fits to extract atomic displacement parameters.…”
Section: Methodsmentioning
confidence: 99%
“…Le Bail 38 fits to the intensity profiles were performed with GSAS 44 on the EXPGUI platform 45 . Pair distribution function (PDF) profiles were obtained by Fourier transforming the measured total scattering intensity up to a maximum momentum transfer of Q max ¼ 24 Å À 1 using established protocols 46,47 as implemented in the programme PDFgetN 48 . The Le Bail fits were used to extract lattice parameters and space-group symmetry, the PDF fits to extract atomic displacement parameters.…”
Section: Methodsmentioning
confidence: 99%
“…36,37 One-dimensional diffraction data were obtained by integrating the raw 2D total scattering data in Fit2D. 38 Pair distribution functions (PDFs) G(r)…”
Section: Nanoparticle Characterizationsmentioning
confidence: 99%
“…The camera was mounted orthogonally to the beam path with a sample-to-detector distance of 208.86 mm which was determined by calibrating with a silicon standard sample. 12 In order to avoid saturation of the detector, each measurement was carried out by multiple exposure to the xrays. Each exposure lasted 10 seconds, and each sample was exposed five times to improve the counting statistics.…”
Section: B High Energy X-ray Diffraction Experimentsmentioning
confidence: 99%