2012
DOI: 10.1002/adfm.201102913
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Rapid Characterization of Ultrathin Layers of Chalcogenides on SiO2/Si Substrates

Abstract: There has been emerging interest in exploring single‐sheet 2D layered structures other than graphene to explore potentially interesting properties and phenomena. The preparation, isolation and rapid unambiguous characterization of large size ultrathin layers of MoS2, GaS, and GaSe deposited onto SiO2/Si substrates is reported. Optical color contrast is identified using reflection optical microscopy for layers with various thicknesses. The optical contrast of these thin layers is correlated with atomic force mi… Show more

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Cited by 463 publications
(404 citation statements)
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“…[13c,19] A typical synthesis produces approximately 300 mL of MoS 2 at a concentration ≥300 ppm (see the Experimental Section) and is easily scalable. Physical characterization of the resultant sheets using atomic force microscopy (n = 100) revealed mean longest diagonals of 0.80 μm with an average thickness of 1.56 nm (n = 40 sheets), which is consistent with a MoS 2 monolayer [20] ( Figure 1 and Figure S1 in the Supporting Information).…”
mentioning
confidence: 48%
“…[13c,19] A typical synthesis produces approximately 300 mL of MoS 2 at a concentration ≥300 ppm (see the Experimental Section) and is easily scalable. Physical characterization of the resultant sheets using atomic force microscopy (n = 100) revealed mean longest diagonals of 0.80 μm with an average thickness of 1.56 nm (n = 40 sheets), which is consistent with a MoS 2 monolayer [20] ( Figure 1 and Figure S1 in the Supporting Information).…”
mentioning
confidence: 48%
“…Optical microscopy, atomic force microscopy and Raman spectroscopy were employed to identify the monolayers 20 . FIG.…”
mentioning
confidence: 99%
“…remarkable electrical and optical properties which are highly dependent on the number of layers present on the materials [5,6]. The surface to volume ratio of the layered materials is also dependent on the number of layers.…”
Section: /3mentioning
confidence: 99%
“…This has direct relevance to develop new molecular design, computing facility, programming and assembly of the new functional materials. remarkable electrical and optical properties which are highly dependent on the number of layers present on the materials [5,6]. The surface to volume ratio of the layered materials is also dependent on the number of layers.…”
Section: Introductionmentioning
confidence: 99%
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