Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005.
DOI: 10.1109/ipfa.2005.1469125
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Rapid diagnostics of an ASIC IP block using dynamic laser scanning

Joy Liao
1
,
Xiaoding Chen
2
,
Howard Marks
3
et al.
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